Rotational computed laminography(CL)has broad application potential in three-dimensional imaging of plate-like objects because it only requires X-rays to pass through the tested object in the thickness direction durin...Rotational computed laminography(CL)has broad application potential in three-dimensional imaging of plate-like objects because it only requires X-rays to pass through the tested object in the thickness direction during the imaging process.In this study,a rectangular cross-section field-of-view rotational CL(RC-CL)is proposed for circuit board imaging.Compared to other rotational CL systems,the field of view is the largest and most suitable for rectangular circuit boards.Meanwhile,as the imaging geometry of RC-CL is significantly different from that of cone-beam CT,the Feldkamp-Davis-Kress(FDK)reconstruction algorithm cannot be used directly.However,transferring the projection data to fit into the CBCT geometry using two-dimensional interpolation introduces interpolation errors.Therefore,an FDK-type analytical reconstruction algorithm applicable to RC-CL was developed.The effectiveness of the method was validated through numerical experiments,and the influence of the tilt angle on the reconstruction results was analyzed.Finally,the RC-CL technique was applied to real defect detection research on circuit boards.展开更多
基金supported by the National Key Research and Development Program of China(No.2022YFF0607802)。
文摘Rotational computed laminography(CL)has broad application potential in three-dimensional imaging of plate-like objects because it only requires X-rays to pass through the tested object in the thickness direction during the imaging process.In this study,a rectangular cross-section field-of-view rotational CL(RC-CL)is proposed for circuit board imaging.Compared to other rotational CL systems,the field of view is the largest and most suitable for rectangular circuit boards.Meanwhile,as the imaging geometry of RC-CL is significantly different from that of cone-beam CT,the Feldkamp-Davis-Kress(FDK)reconstruction algorithm cannot be used directly.However,transferring the projection data to fit into the CBCT geometry using two-dimensional interpolation introduces interpolation errors.Therefore,an FDK-type analytical reconstruction algorithm applicable to RC-CL was developed.The effectiveness of the method was validated through numerical experiments,and the influence of the tilt angle on the reconstruction results was analyzed.Finally,the RC-CL technique was applied to real defect detection research on circuit boards.
