A new exact and universal conformal mapping is proposed. Using Muskhelishvili＇s complex potential method, the plane elasticity problem of power function curved cracks is investigated with an arbitrary power of a natu...A new exact and universal conformal mapping is proposed. Using Muskhelishvili＇s complex potential method, the plane elasticity problem of power function curved cracks is investigated with an arbitrary power of a natural number, and the general solutions of the stress intensity factors （SIFs） for mode I and mode II at the crack tip are obtained under the remotely uniform tensile loads. The present results can be reduced to the well-known solutions when the power of the function takes different natural numbers. Numerical examples are conducted to reveal the effects of the coefficient, the power, and the projected length along the x-axis of the power function curved crack on the SIFs for mode I and mode II.展开更多
基金supported by the National Natural Science Foundation of China(Nos.10932001,11072015, and 10761005)the Scientific Research Key Program of Beijing Municipal Commission of Education (No.KZ201010005003)+1 种基金the Specialized Research Fund for the Doctoral Program of Higher Education of China(No.20101102110016)the Ph.D.Innovation Foundation of Beijing University of Aeronautics and Astronautics(No.300351)
文摘A new exact and universal conformal mapping is proposed. Using Muskhelishvili＇s complex potential method, the plane elasticity problem of power function curved cracks is investigated with an arbitrary power of a natural number, and the general solutions of the stress intensity factors （SIFs） for mode I and mode II at the crack tip are obtained under the remotely uniform tensile loads. The present results can be reduced to the well-known solutions when the power of the function takes different natural numbers. Numerical examples are conducted to reveal the effects of the coefficient, the power, and the projected length along the x-axis of the power function curved crack on the SIFs for mode I and mode II.
