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Laser-induced damage threshold in HfO_(2)/SiO_(2) multilayer films irradiated by β-ray 被引量:1
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作者 Mei-Hua Fang Peng-Yu Tian +4 位作者 Mao-Dong Zhu Hong-Ji Qi Tao Fei Jin-Peng Lv Hui-Ping Liu 《Chinese Physics B》 SCIE EI CAS CSCD 2019年第2期294-298,共5页
Post-processing can effectively improve the resistance to laser damage in multilayer films used in a high power laser system.In this work,HfO_(2)/SiO_(2)multilayer films are prepared by e-beam evaporation and thenβ-r... Post-processing can effectively improve the resistance to laser damage in multilayer films used in a high power laser system.In this work,HfO_(2)/SiO_(2)multilayer films are prepared by e-beam evaporation and thenβ-ray irradiation is employed as the post-processing method.The particle irradiation affects the laser induced damage threshold(LIDT),which includes defects,surface roughness,packing density and residual stress.The residual stress that is relaxed during irradiation changes from compressive stress into tensile stress.Our results indicate that appropriate tensile stress can improve LIDT remarkably.In view of the fact that LIDT rises from 8 J/cm^(2)to 12 J/cm^(2),i.e.,50%increase,after the film has been irradiated by 2.2×10^(13)/cm^(2)β-ray,the particle irradiation can be used as a controllable and desirable postprocessing method to improve the resistance to laser induced damage. 展开更多
关键词 Β-RAY IRRADIATION hfo_(2)/sio_(2) multilayer film residual stress LASER-INDUCED damage threshold
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Effects of Multilayer Structure of Ag-SiO_(2) Films on the Photonic Band Gap 被引量:1
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作者 Song Zhitang Chen Su +1 位作者 Wang Yang Feng Songlin 《光子学报》 EI CAS CSCD 北大核心 2005年第11期1736-1739,共4页
The one-dimensional photonic crystals of Ag/SiO_(2) system are studied to investigate the photonic band gaps (PBG). The samples were prepared by the ultra-high vacuum electron beam evaporation. The clear band gaps wer... The one-dimensional photonic crystals of Ag/SiO_(2) system are studied to investigate the photonic band gaps (PBG). The samples were prepared by the ultra-high vacuum electron beam evaporation. The clear band gaps were observed. Satisfactory agreement between experimental and calculated results was obtained without fitting. The thickness of SiO_(2 )film has influence on the photonic band gap, as well as it awfully affects the transmittance of Ag. More layers can get clearer PBG. 展开更多
关键词 Photonic crystal Photonic band gap Ultra-high vacuum electron beam evaporation Ag/sio2 multilayer
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Effects of Si-Layer-Thickness Ratio on UV-Light-Emission Intensity from Si/SiO<SUB>2</SUB>Multilayered Thin Films Prepared Using Radio-Frequency Sputtering
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作者 Kenta Miura Hitomi Hoshino +1 位作者 Masashi Honmi Osamu Hanaizumi 《Materials Sciences and Applications》 2015年第3期215-219,共5页
We investigated the effects of Si-layer-thickness ratios on ultraviolet (UV) peak intensities of Si/ SiO2 multilayered films produced by alternately stacking several-nanometer-thick Si and SiO2 layers using radio-freq... We investigated the effects of Si-layer-thickness ratios on ultraviolet (UV) peak intensities of Si/ SiO2 multilayered films produced by alternately stacking several-nanometer-thick Si and SiO2 layers using radio-frequency sputtering for the first time. The Si-layer-thickness ratio of the Si/SiO2 film is a very important parameter for enhancing the peak intensity because the ratio is concerned with the size of Si nanocrystals in the film, which might affect the intensity of the UV light emission from the film. We prepared seven samples with various estimated Si-layer-thickness ratios, and measured the photoluminescence spectra of the samples after annealing at 1150°C, 1200°C, or 1250°C for 25 min. From our experiments, we estimate that the proper Si-layer-thickness ratio to obtain the strongest UV peaks from the Si/SiO2 multilayered films is around 0.29. Such a UV-lightemitting thin film is expected to be used in future higher-density optical-disk systems. 展开更多
关键词 SI sio2 multilayer SPUTTERING UV-LIGHT Emission
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N_(2)/Ar流量比对TiZrN/TiN纳米多层薄膜微观结构和性能的影响
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作者 魏永强 张华森 +5 位作者 张晓晓 顾艳阳 刘畅 吕怿东 韦春贝 钟素娟 《表面技术》 北大核心 2025年第14期92-104,共13页
目的 通过改变N2/Ar流量比,研究TiZrN/TiN纳米多层薄膜微观结构和性能的变化规律。方法采用电弧离子镀(Arc Ion Plating,AIP)和高功率脉冲磁控溅射(High Power Pulsed Magnetron Sputtering,Hi PIMS)复合方法,通过调节N_(2)/Ar流量比,... 目的 通过改变N2/Ar流量比,研究TiZrN/TiN纳米多层薄膜微观结构和性能的变化规律。方法采用电弧离子镀(Arc Ion Plating,AIP)和高功率脉冲磁控溅射(High Power Pulsed Magnetron Sputtering,Hi PIMS)复合方法,通过调节N_(2)/Ar流量比,分别在M2高速钢和单晶硅片(100)上制备TiZrN/TiN纳米多层薄膜。研究N2/Ar流量比对TiZrN/TiN纳米多层薄膜形貌结构、元素成分、相结构、纳米硬度、膜基结合力、摩擦磨损性能和耐腐蚀性能的影响。结果在N2/Ar流量比为35/65时,薄膜表面粗糙度最低达到0.298μm;在N2/Ar流量比为40/60时,薄膜总厚度最高达574 nm;TiZrN/TiN纳米多层薄膜均以(111)晶面为择优取向,硬度在22.95~27.15 GPa。在N2/Ar流量比为25/75时,TiZrN/TiN纳米多层薄膜离子轰击作用最强,Zr/(Ti+Zr)的值较大(0.088),硬度和弹性模量最高分别达到27.15 GPa和271.14 GPa。在N_(2)/Ar流量比为25/75和30/70时,TiZrN/TiN纳米多层薄膜的膜基结合力最好,达到HF1等级。TiZrN/TiN纳米多层薄膜稳定摩擦系数均在0.8左右,磨损率先增大后减小。N_(2)/Ar流量比为25/75时,TiZrN/TiN纳米多层薄膜的自腐蚀电位和自腐蚀电流密度分别为-0.546 V和1.167μA/cm^(2),薄膜对M2高速钢基体的保护率最高达到87.9%。结论采用电弧离子镀和高功率脉冲磁控溅射复合方法,大幅改善了薄膜表面质量;N_(2)/Ar流量比可改变离子轰击强度的强弱,随着N_(2)/Ar流量比的增加,沉积离子轰击强度逐渐减弱,薄膜硬度和耐腐蚀性能逐渐下降;在N_(2)/Ar流量比为25/75时,薄膜综合性能最优。 展开更多
关键词 高功率脉冲磁控溅射 电弧离子镀 TiZrN/TiN纳米多层薄膜 N_(2)/Ar流量比 纳米硬度 耐磨性
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Syntheses and Tribological Property of CrMoN/MoS2 Multilayer Films on Piston Rings of Heavy Vehicle Engine 被引量:1
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作者 王宪成 李奇 +1 位作者 LI Ruoting DI Yuelan 《Journal of Wuhan University of Technology(Materials Science)》 SCIE EI CAS 2016年第2期429-434,共6页
In order to prolong the service life of piston rings of heavy vehicle engine and decrease the friction and wear of piston rings and cylinder liner,CrMoN/MoS_2 multilayer films were deposited on the surface of rings by... In order to prolong the service life of piston rings of heavy vehicle engine and decrease the friction and wear of piston rings and cylinder liner,CrMoN/MoS_2 multilayer films were deposited on the surface of rings by magnetron sputtering and low temperature ion sulfuration.FESEM equipped with EDX was adopted to analyze the compositions and morphologies of surface,cross-section,and wear scars of the multilayer films.The nano-hardness and Young's modulus of the films were measured by a nano tester.Tribologicalproperties of the films were tested by an SRV~174;4 wear tester.The experimentalresults indicate that the structures of the multilayer films are dense and compact.The films possess nano hardness value of approximately 26.7 GPa and superior ability of plastic deformation resistance.The multilayer films can activate solid lubricating,and possess an excellent antifriction and wear resistance under the conditions of heavy load,high frequency,high temperature,and dynamic load. 展开更多
关键词 CrMoN/MoS_2 multilayer films piston ring cylinder liner wear mechanisms
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HfO_2/SiO_2高反射膜的缺陷及其激光损伤 被引量:21
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作者 胡建平 陈梅 +1 位作者 付雄鹰 柴林 《强激光与粒子束》 EI CAS CSCD 北大核心 2001年第5期529-532,共4页
用原子力、Normaski和扫描电子显微镜等分析仪器 ,对高损伤阈值薄膜常采用的 Hf O2 /Si O2 薄膜进行了表面显微图象研究 ,分析了薄膜常见的表面缺陷 ,如节瘤 ,孔洞和划痕等。薄膜表面缺陷的激光损伤实验表明 ,不同缺陷的抗激光损伤能力... 用原子力、Normaski和扫描电子显微镜等分析仪器 ,对高损伤阈值薄膜常采用的 Hf O2 /Si O2 薄膜进行了表面显微图象研究 ,分析了薄膜常见的表面缺陷 ,如节瘤 ,孔洞和划痕等。薄膜表面缺陷的激光损伤实验表明 ,不同缺陷的抗激光损伤能力大不相同 ,节瘤缺陷最低 ,约为 1 5 J/ cm2 ,薄膜的损伤阈值主要由其决定 ,孔洞的激光损伤能力与节瘤相比较高 ,约为节瘤的 2~ 3倍。节瘤缺陷在低能量密度的激光损伤所形成的孔洞 ,与镀制过程中形成的孔洞形貌相似 ,激光再损伤能力也相似。 展开更多
关键词 hfo2/sio2高反射薄膜 表面缺陷 激光损伤 原子电子显微镜 SEM 显微分析
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Improvement of adhesion properties of TiB_2 films on 316L stainless steel by Ti interlayer films 被引量:4
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作者 夏木建 丁红燕 +1 位作者 周广宏 章跃 《Transactions of Nonferrous Metals Society of China》 SCIE EI CAS CSCD 2013年第10期2957-2961,共5页
The periodic [Ti/TiB2]n (n=l, 2, 3) multilayered films were prepared on the substrate of AISI 316L stainless steel by magnetron sputtering to enhance the adhesion of TiB2 films based on the remarkable mechanical per... The periodic [Ti/TiB2]n (n=l, 2, 3) multilayered films were prepared on the substrate of AISI 316L stainless steel by magnetron sputtering to enhance the adhesion of TiB2 films based on the remarkable mechanical performance of layered films. The influence of periods on microstructure, adhesion and hardness of [Ti/TiB2]n multilayered films was studied. X-ray diffraction (XRD) analysis shows that the monolayer TiB2 films exhibit (001) preferred orientation, and the preferred orientation of [Ti/TiB2], multilayered films transfers from (001) to (100) with the increase of periods. The cross-sectional morphology of each film displays homogeneity by field emission scanning electron microscopy (FESEM). The hardness of the films measured via nanoindention changes from 20 to 26 GPa with the increase of periods. These values of hardness are a bit lower than that of the monolayer TiB2 films which is up to 33 GPa. However, the [Ti/TiB2]n multilayered films present a considerably good adhesion, which reaches a maximum of 24 N, in comparison with the monolayer TiB2 films according to the experimental results. 展开更多
关键词 multilayered films ADHEsioN TiB2 films magnetron sputtering nano-hardness
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采用HfO_2/SiO_2溶胶-凝胶薄膜制备衍射光栅 被引量:4
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作者 谢永军 赵福华 +2 位作者 魏伟 赵小侠 赵卫 《光子学报》 EI CAS CSCD 北大核心 2008年第1期133-135,共3页
采用溶胶-凝胶方法制备了具有光敏性的HfO2/SiO2溶胶-凝胶薄膜,并利用其光敏性制备了衍射光栅.采用XPS分析了薄膜的成份,证实了Hf元素的存在.并用椭偏仪测试了薄膜的折射率,结果证实了HfO2的加入确实提高了体系的折射率.利用其光敏性,采... 采用溶胶-凝胶方法制备了具有光敏性的HfO2/SiO2溶胶-凝胶薄膜,并利用其光敏性制备了衍射光栅.采用XPS分析了薄膜的成份,证实了Hf元素的存在.并用椭偏仪测试了薄膜的折射率,结果证实了HfO2的加入确实提高了体系的折射率.利用其光敏性,采用X射线作曝光光源通过掩模进行曝光,利用曝光部分与未曝光部分的溶解度差,在薄膜上制备了高为0.8μm、周期为1μm的衍射光栅. 展开更多
关键词 信息光学 hfo2/sio2溶胶-凝胶 光栅 光敏
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Remanence Enhancement Effect in Ni_(0.7)Zn_(0.3)Fe_2O_4/Co_(0.8)Fe_(2.2)O_4 Ferrite Multilayer Film
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作者 范程华 王群京 訾振发 《Chinese Physics Letters》 SCIE CAS CSCD 2016年第11期104-107,共4页
Ni0.7Zn0.3Fe2O4/Co0.8Fe2.2O4(NZFO/CFO) multilayer films are fabricated on Si(lO0) substrates by the chemical solution deposition method. The mierostructure and magnetic properties are systematically investigated. ... Ni0.7Zn0.3Fe2O4/Co0.8Fe2.2O4(NZFO/CFO) multilayer films are fabricated on Si(lO0) substrates by the chemical solution deposition method. The mierostructure and magnetic properties are systematically investigated. The results of field-emission scanning electronic microscopy show that the grain size of the NZFO/CFO multilayer film is quite uniform and the thickness is about 30Ohm. The remanence enhancement effect of the NZFO/CFO multilayer film can be mainly attributed to the exchange coupling interaction between NZFO and CFO ferrite films, which is in favor of the design and fabrication of modern electronic devices. 展开更多
关键词 CFO Fe2O4/Co O4 Ferrite multilayer film of ZN in
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Hybrid Electrochromic Multilayer Films Based on Fe(II)-Metalloviologens and TiO_2 Nanoparticles
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作者 WANG Rui LIU Dong-xu +4 位作者 YANG Yang YU Da-hui YAO Wei-guo DENG Chang-chun DONG Wen-fei 《Chemical Research in Chinese Universities》 SCIE CAS CSCD 2012年第5期869-873,共5页
Metallosupramolecular coordination polyelectrolyte, Fe(II)-metalloviologen(FEN), was prepared by the reaction of Fe(II) with a novel bisterpyridine ligand. As active components, FENs could be assembled into elec... Metallosupramolecular coordination polyelectrolyte, Fe(II)-metalloviologen(FEN), was prepared by the reaction of Fe(II) with a novel bisterpyridine ligand. As active components, FENs could be assembled into electrochromic multilayer films with negative charged polystyrene sulfate(PSS) by the sequential deposition layer-by-layer technique. Numerous analytical instruments, such as UV-Vis spectroscopy, atomic force microscopy(AFM), tunneling electron microscopy(TEM), zeta-potential measurement and electrochemical measurement have been utilized to characterize their morphology, optical and electrochromic properties. It has been observed that as-prepared films exhibited multi-colour changes by triggering with different potentials. However, the low optical contrast of multilayer films would limit their further applications. In order to overcome this problem, semiconductor TiO2 nanoparticles(TiO2) were incorporated into FEN multilayers by layer-by-layer approach. By carefully optimizing the film structure, as-resulted hybrid films containing FEN, TiO2 and PSS exhibited high optical contrast, suitable response time and long-term stability. Such hybrid films should be promising candidates to meet the requirements for developing flexible displays and electrochromic devices. 展开更多
关键词 Electrocromic multilayer film TIO2 Metalloviologen Optical contrast
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等离子体辅助沉积HfO_2/SiO_2减反、高反光学薄膜 被引量:3
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作者 付雄鹰 孔明东 +5 位作者 马平 邱服民 马道远 柴林 胡建平 李瑞洁 《光学技术》 CAS CSCD 1998年第3期91-93,共3页
本文报导了用等离子体辅助(Plasma-IAD)沉积技术沉积HfO2/SiO2减反及高反光学薄膜。在波长1064nm处,HfO2/SiO2减反膜透过率大于99.5%,HfO2/SiO2高反膜反射率大于99.5%。
关键词 减反膜 高反膜 光学 薄膜 IAD 氧化铪 氧化硅
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HfO_2/SiO_2多层高反膜脉冲YAG激光预处理机理的研究 被引量:2
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作者 周业为 谢建 +1 位作者 李育德 曾传相 《激光杂志》 CAS CSCD 北大核心 2000年第2期13-13,16,共2页
本文研究了HfO2 /SiO2 多层高反膜脉冲YAG激光预处理提高抗激光损伤阈值的机理。通过分析和计算 ,我们提出了一种物理模型 ,即热扩散模型。由于扩散结果 ,导致HfO2 膜层的折射率增加 ,致使HfO2 、SiO2 膜层交界处光驻波波峰降低 。
关键词 hfo2/sio2 多层高反膜 激光预处理 YAG激光
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Characteristics of Sb6Te4/VO2 Multilayer Thin Films for Good Stability and Ultrafast Speed Applied in Phase Change Memory
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作者 Yi-Feng Hu Xuan Guo +1 位作者 Qing-Qian Qin Tian-Shu Lai 《Chinese Physics Letters》 SCIE CAS CSCD 2018年第9期53-56,共4页
The Sb6 Te4/VO2 multilayer thin films are prepared by magnetron sputtering and the potential application in phase change memory is investigated in detail. Compared with Sb6 Te4, Sb6 Te4/VO2 multilayer composite thin f... The Sb6 Te4/VO2 multilayer thin films are prepared by magnetron sputtering and the potential application in phase change memory is investigated in detail. Compared with Sb6 Te4, Sb6 Te4/VO2 multilayer composite thin films have higher phase change temperature and crystallization resistance, indicating better thermal stability and less power consumption. Also, Sb6 Te4/VO2 has a broader energy band of 1.58 eV and better data retention (125℃ for 103/). The crystallization is suppressed by the multilayer interfaces in Sbf Te4/VO2 thin film with a smaller rms surface roughness for Sbf Te4/VO2 than monolayer Sb4Te6. The picosecond laser technology is applied to study the phase change speed. A short crystallization time of 5.21 ns is realized for the Sb6Te4 (2nm)/VO2 (8nm) thin film. The Sb6 Te4/VO2 multilayer thin film is a potential and competitive phase change material for its good thermal stability and fast phase change speed. 展开更多
关键词 VO Te Characteristics of Sb6Te4/VO2 multilayer Thin films for Good Stability and Ultrafast Speed Applied in Phase Change Memory Sb
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基频HfO_2/SiO_2高反射薄膜激光损伤生长特性 被引量:2
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作者 张艳云 马彬 +2 位作者 马宏平 焦宏飞 程鑫彬 《强激光与粒子束》 EI CAS CSCD 北大核心 2013年第9期2275-2280,共6页
以1064nm波长作用下的HfO2/SiO2高反射薄膜为研究对象,研究了高反射薄膜在损伤生长过程中分层剥落初始损伤结构的变化规律、损伤形貌特征和损伤生长阈值等特性。实验结果表明:分层剥落初始损伤结构的横向尺寸随激光能量密度的增加呈分... 以1064nm波长作用下的HfO2/SiO2高反射薄膜为研究对象,研究了高反射薄膜在损伤生长过程中分层剥落初始损伤结构的变化规律、损伤形貌特征和损伤生长阈值等特性。实验结果表明:分层剥落初始损伤结构的横向尺寸随激光能量密度的增加呈分段线性增长,破斑沿纵向拓展的损伤生长阈值是沿横向拓展的损伤生长阈值的2倍以上,初始损伤结构横向尺寸的生长率与能量密度呈指数关系,且生长阈值随着辐照次数的增加显著降低。 展开更多
关键词 hfo2 sio2高反射薄膜 分层剥落 损伤生长 激光损伤阈值 横向尺寸
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具有辐射聚合能力的HfO_2/SiO_2溶胶-凝胶玻璃的制备及其X射线光刻性能研究 被引量:2
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作者 赵福华 谢永军 +2 位作者 许素莲 刘刚 付绍军 《高等学校化学学报》 SCIE EI CAS CSCD 北大核心 2006年第7期1376-1379,共4页
采用溶胶-凝胶方法制备了一种新颖的具有辐射聚合能力的H fO2/S iO2凝胶薄膜.并采用X射线作曝光光源对薄膜进行了曝光,通过FTIR的测试,分析了薄膜曝光前后的结构变化.结果表明,该材料具有良好的辐射聚合能力.采用XPS分析了薄膜的成分,... 采用溶胶-凝胶方法制备了一种新颖的具有辐射聚合能力的H fO2/S iO2凝胶薄膜.并采用X射线作曝光光源对薄膜进行了曝光,通过FTIR的测试,分析了薄膜曝光前后的结构变化.结果表明,该材料具有良好的辐射聚合能力.采用XPS分析了薄膜的成分,并证实了H f元素的存在.用椭偏仪测试了薄膜的折射率,结果证实,加入H fO2提高了体系的折射率.利用其辐射聚合能力,采用X射线通过掩模板进行曝光,利用曝光部分与未曝光部分在溶剂中的溶解度差,在薄膜上制备了高为0.8μm、周期为1μm的衍射光栅,进一步证实了材料具有良好的辐射聚合能力. 展开更多
关键词 hfo2/sio2 溶胶-凝胶 辐射聚合 光栅
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HfO_2/SiO_2增透膜激光诱导损伤形貌分析 被引量:1
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作者 罗康 蒲云体 +4 位作者 乔曌 刘志超 罗晋 朱基亮 马平 《广州化工》 CAS 2015年第4期90-92,共3页
用电子束蒸发法制备了Hf O2/Si O2增透膜样品,并进行退火。测量未退火样品与退火样品的透射光谱,发现退火样品的光谱明显向短波方向移动,原因是退火后薄膜中的吸附水被去除。使用Nd:YAG激光器在"S-on-1"模式下对样品进行了激... 用电子束蒸发法制备了Hf O2/Si O2增透膜样品,并进行退火。测量未退火样品与退火样品的透射光谱,发现退火样品的光谱明显向短波方向移动,原因是退火后薄膜中的吸附水被去除。使用Nd:YAG激光器在"S-on-1"模式下对样品进行了激光诱导损伤处理。两种样品的损伤形貌均主要是损伤坑。考虑到损伤的成因是基底的亚表面微裂纹中的吸收颗粒吸收激光能量后导致裂纹扩大,最终形成损伤坑。基于这种损伤机制,退火对损伤没有明显影响。通过显微镜在损伤形貌中观察到了冲击波传输形成的波动条纹。 展开更多
关键词 增透膜 激光诱导损伤 损伤形貌 hfo2/sio2
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Microstructures and magnetic properties of [SiO_2/FePt]_5/Ag thin films 被引量:2
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作者 范九萍 许小红 +2 位作者 江凤仙 田宝强 武海顺 《Journal of Central South University of Technology》 EI 2008年第1期11-14,共4页
[SiO2/FePt]5/Ag thin films were deposited by RF magnetron sputtering on the glass substrates and post annealing at 550 ℃ for 30 min in vacuum. Vibrating sample magnetometer and X-ray diffraction analyser were applied... [SiO2/FePt]5/Ag thin films were deposited by RF magnetron sputtering on the glass substrates and post annealing at 550 ℃ for 30 min in vacuum. Vibrating sample magnetometer and X-ray diffraction analyser were applied to study the magnetic properties and microstructures of the films. The results show that without Ag underlayer [SiO2/FePt]5 films deposited onto the glass are FCC disordered; with the addition of Ag underlayer [SiO]FePt]5/Ag films are changed into L10 and (111) mixed texture. The variation of the SiO2 nonmagnetic layer thickness in [SiO2/FePt]5/Ag films indicates that SiO2-doping plays an important role in improving the order parameter and the perpendicular magnetic anisotropy, and reducing the grain size and intergrain interactions. By controlling SiO2 thickness the highly perpendicular magnetic anisotropy can be obtained in the [SiO2 (0.6 nm)/FePt (3 nm)]5/Ag (50 nm) films and highly (001)-oriented films can be obtained in the [SiO2 (2 nm)/FePt (3 nm)]5/Ag (50 nm) films. 展开更多
关键词 [sio2/FePt]5 multilayer films sio2-doping Ag underlayer (001) orientation
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Optical and Magnetic Properties of Fe_2O_3/SiO_2 Nano-composite Films 被引量:2
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作者 关飞飞 姚兰芳 《Journal of Wuhan University of Technology(Materials Science)》 SCIE EI CAS 2010年第2期206-209,共4页
Fe2O3/SiO2 nano-composite films were prepared by sol-gel technique combining heat treatment in the range of 100-900 ℃. The particle size was observed by FE-SEM. Optical properties of the films were investigated by UV... Fe2O3/SiO2 nano-composite films were prepared by sol-gel technique combining heat treatment in the range of 100-900 ℃. The particle size was observed by FE-SEM. Optical properties of the films were investigated by UV-visible spectra. Structural and magnetic characteristics were investigated through FT-IR and VSM. The transparency of the Fe2O3/SiO2 nano-composite films decreased with the content of the Fe2O3. Water and organic solvent in the films were evaporated with heat treatment, so the transparency of the films was enhanced under high temperature. It is also found that the saturation magnetization (Ms) of the films increases with the temperature. As the content of the Fe2O3 increases, when the content of the Fe2O3 is around 30wt%, the Ms of the films has a maximum value. 展开更多
关键词 sol-gel technique Fe2O3/sio2 nano-composite films MAGNETISM
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Controlling Shell Thickness of PS/SiO_2 Core-Shell Particles and Their Crystallization into 3-D Ordered Thin Film 被引量:1
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作者 武晓峰 陈运法 +1 位作者 魏连启 王奇 《过程工程学报》 CAS CSCD 北大核心 2006年第z2期285-289,共5页
PS/SiO2 particles with core-shell structure were synthesized by coating silica on surface of polystyrene(PS) colloidal particles.The reaction parameters,such as initial tetraethyl orthosilicate(TEOS) concentration,wat... PS/SiO2 particles with core-shell structure were synthesized by coating silica on surface of polystyrene(PS) colloidal particles.The reaction parameters,such as initial tetraethyl orthosilicate(TEOS) concentration,water concentration and reaction temperature,have been investigated to control the thickness of silica shells.The shell thickness was prepositional to the square root of the initial concentration of TEOS and first increased with increasing water concentration,reached a maximum at about 2.0 mol/L and then started decreasing beyond that concentration.It was also found that the shell thickness decreased firstly with the reaction temperature added,then tended to a constant.The so-synthesized PS/SiO2 core-shell particles were directly crystallized into 3-D ordered thin film,then sintered at 570℃ into the ordered macroporous thin film.Compared with the conditional method,the present approach avoids repeatedly filling the precursor in the templetes and save time more. 展开更多
关键词 PS/sio2 CORE-SHELL PARTICLES ORDERED THIN film
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The effects of radiation damage on power VDMOS devices with composite SiO_2-Si_3N_4 films 被引量:1
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作者 高博 刘刚 +5 位作者 王立新 韩郑生 宋李梅 张彦飞 腾瑞 吴海舟 《Chinese Physics B》 SCIE EI CAS CSCD 2013年第3期393-398,共6页
Total dose effects and single event effects on radiation-hardened power vertical double-diffusion metal oxide semiconductor(VDMOS) devices with composite SiO2-Si3N4 film gates are investigated.The relationships amon... Total dose effects and single event effects on radiation-hardened power vertical double-diffusion metal oxide semiconductor(VDMOS) devices with composite SiO2-Si3N4 film gates are investigated.The relationships among the important electrical parameters of the samples with different thickness SiO2-Si3N4 films,such as threshold voltage,breakdown voltage,and on-state resistance in accumulated dose,are discussed.The total dose experiment results show that the breakdown voltage and the on-state resistance barely change with the accumulated dose.However,the relationships between the threshold voltages of the samples and the accumulated dose are more complex,and not only positively drift,but also negatively drift.At the end of the total dose experiment,we select the group of samples which have the smaller threshold voltage shift to carry out the single event effect studies.We find that the samples with appropriate thickness ratio SiO2-Si3N4 films have a good radiation-hardening ability.This method may be useful in solving both the SEGR and the total dose problems with the composite SiO2-Si3N4 films. 展开更多
关键词 power VDMOS device total dose effects single event effects composite sio2-Si3N4 films
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