Based on the electron dynamic diffraction, phase shift of the exit wave function vs misorientation of the incident electron beam from the exact zone axis has been calculated for the [001] oriented copper. The result s...Based on the electron dynamic diffraction, phase shift of the exit wave function vs misorientation of the incident electron beam from the exact zone axis has been calculated for the [001] oriented copper. The result shows that the peak of phase shift is the maximum at the atom position as the electron beam along the exact [001] zone axis, and the peak value of phase shift decreases as increases of the misorientation. At small misorientation, i.e. less than 5 degree, change of the phase shift is minimal. The peak value of phase shift decreases significantly when the incident beam deviates form the zone axis over 10 degree and the exit wave has a planar configuration as the misoriention angle arrives -17 degree. The effect of this phase shift characteristics on the information extracted from the hologram has also been considered.展开更多
针对高分辨透射电子显微镜(high⁃resolution transmission electron microscope,HRTEM)所拍摄的图像存在像差造成的分辨率下降问题,本文提出一种自动测量像差参数的方案:以相对随机的方式,模仿实验像与模拟像的人工对比过程,可以求解电...针对高分辨透射电子显微镜(high⁃resolution transmission electron microscope,HRTEM)所拍摄的图像存在像差造成的分辨率下降问题,本文提出一种自动测量像差参数的方案:以相对随机的方式,模仿实验像与模拟像的人工对比过程,可以求解电镜像差。求得的像差结合改进单图重建波函数算法,可以去除图像的像差影响并获得单张图的波函数的相位像。本文运用模拟像验证后,方案与算法用于单层二硫化钼的实验HRTEM像,测得像差参数精度高,校正后的图像细节更优。本文算法计算精度好、效率高,有望应用于针对晶格像的像差测量问题。展开更多
基金financially supported tional Natural Science Foundation of China No. 60271028.
文摘Based on the electron dynamic diffraction, phase shift of the exit wave function vs misorientation of the incident electron beam from the exact zone axis has been calculated for the [001] oriented copper. The result shows that the peak of phase shift is the maximum at the atom position as the electron beam along the exact [001] zone axis, and the peak value of phase shift decreases as increases of the misorientation. At small misorientation, i.e. less than 5 degree, change of the phase shift is minimal. The peak value of phase shift decreases significantly when the incident beam deviates form the zone axis over 10 degree and the exit wave has a planar configuration as the misoriention angle arrives -17 degree. The effect of this phase shift characteristics on the information extracted from the hologram has also been considered.
文摘针对高分辨透射电子显微镜(high⁃resolution transmission electron microscope,HRTEM)所拍摄的图像存在像差造成的分辨率下降问题,本文提出一种自动测量像差参数的方案:以相对随机的方式,模仿实验像与模拟像的人工对比过程,可以求解电镜像差。求得的像差结合改进单图重建波函数算法,可以去除图像的像差影响并获得单张图的波函数的相位像。本文运用模拟像验证后,方案与算法用于单层二硫化钼的实验HRTEM像,测得像差参数精度高,校正后的图像细节更优。本文算法计算精度好、效率高,有望应用于针对晶格像的像差测量问题。
