X-ray ptychographic tomography is a nondestructive method for three dimensional(3D)imaging with nanometer-sized resolvable features.The size of the volume that can be imaged is almost arbitrary,limited only by the pen...X-ray ptychographic tomography is a nondestructive method for three dimensional(3D)imaging with nanometer-sized resolvable features.The size of the volume that can be imaged is almost arbitrary,limited only by the penetration depth and the available scanning time.Here we present a method that rapidly accelerates the imaging operation over a given volume through acquiring a limited set of data via large angular reduction and compensating for the resulting ill-posedness through deeply learned priors.The proposed 3D reconstruction method“RAPID”relies initially on a subset of the object measured with the nominal number of required illumination angles and treats the reconstructions from the conventional two-step approach as ground truth.It is then trained to reproduce equal fidelity from much fewer angles.After training,it performs with similar fidelity on the hitherto unexamined portions of the object,previously not shown during training,with a limited set of acquisitions.In our experimental demonstration,the nominal number of angles was 349 and the reduced number of angles was 21,resulting in a×140 aggregate speedup over a volume of 4.48×93.18×3.92μm^(3) and with(14 nm)^(3) feature size,i.e.-10^(8) voxels.RAPID’s key distinguishing feature over earlier attempts is the incorporation of atrous spatial pyramid pooling modules into the deep neural network framework in an anisotropic way.We found that adjusting the atrous rate improves reconstruction fidelity because it expands the convolutional kernels’range to match the physics of multi-slice ptychography without significantly increasing the number of parameters.展开更多
Noninvasive X-ray imaging of nanoscale three-dimensional objects,such as integrated circuits(ICs),generally requires two types of scanning:ptychographic,which is translational and returns estimates of the complex elec...Noninvasive X-ray imaging of nanoscale three-dimensional objects,such as integrated circuits(ICs),generally requires two types of scanning:ptychographic,which is translational and returns estimates of the complex electromagnetic field through the IC;combined with a tomographic scan,which collects these complex field projections from multiple angles.Here,we present Attentional Ptycho-Tomography(APT),an approach to drastically reduce the amount of angular scanning,and thus the total acquisition time.APT is machine learning-based,utilizing axial self-Attention for Ptycho-Tomographic reconstruction.APT is trained to obtain accurate reconstructions of the ICs,despite the incompleteness of the measurements.The training process includes regularizing priors in the form of typical patterns found in IC interiors,and the physics of X-ray propagation through the IC.We show that APT with×12 reduced angles achieves fidelity comparable to the gold standard Simultaneous Algebraic Reconstruction Technique(SART)with the original set of angles.When using the same set of reduced angles,then APT also outperforms Filtered Back Projection(FBP),Simultaneous Iterative Reconstruction Technique(SIRT)and SART.The time needed to compute the reconstruction is also reduced,because the trained neural network is a forward operation,unlike the iterative nature of these alternatives.Our experiments show that,without loss in quality,for a 4.48×93.2×3.92µm^(3) IC(≃6×10^(8) voxels),APT reduces the total data acquisition and computation time from 67.96 h to 38 min.We expect our physics-assisted and attention-utilizing machine learning framework to be applicable to other branches of nanoscale imaging,including materials science and biological imaging.展开更多
Controllable conjunction of semiconductors with metal organic frameworks(MOFs)has been an efficient tool to enhance the chemical and physical properties of semiconductors by forming semiconductor–MOF hybrid structure...Controllable conjunction of semiconductors with metal organic frameworks(MOFs)has been an efficient tool to enhance the chemical and physical properties of semiconductors by forming semiconductor–MOF hybrid structures.Herein,a novel MOFs-derived strategy to fabricate ZnO/ZIF-8 hybrid photocatalysts via the micro-catalysis technique by using ZIF-8 as a precursor and AgNO_(3) as a catalyst is reported.The properties and structures of ZnO/ZIF-8 hybrid photocatalysts can be effectively controlled by adjusting the concentration of AgNO_(3) solution.The as-prepared ZnO/ZIF-8 hybrid photocatalysts were characterized by XRD,SEM,TEM,UV-vis,BET and other techniques.Their photocatalytic performances were evaluated by degradation of rhodamine B(RhB)solution under UV light.The results indicate that ZnO/ZIF-8 photocatalysts exhibit excellent photocatalytic properties.ZnO/ZIF-8(50)exhibits the highest photocatalytic activity and can degrade 98.17%RhB after 12 min of UV light irradiation,which is higher than the degradation ability of P25(95.05%),benefiting from the synergistic effect of ZnO and ZIF-8.Furthermore,the ZnO/ZIF-8(50)photocatalyst shows high photostability.After four repeated cycles,its photocatalytic efficiency could be maintained at 95.54%.展开更多
基金funded by the Intelligence Advanced Research Projects Activity,Office of the Director of National Intelligence(IARPA-ODNI)under contract FA8650-17-C-9113.
文摘X-ray ptychographic tomography is a nondestructive method for three dimensional(3D)imaging with nanometer-sized resolvable features.The size of the volume that can be imaged is almost arbitrary,limited only by the penetration depth and the available scanning time.Here we present a method that rapidly accelerates the imaging operation over a given volume through acquiring a limited set of data via large angular reduction and compensating for the resulting ill-posedness through deeply learned priors.The proposed 3D reconstruction method“RAPID”relies initially on a subset of the object measured with the nominal number of required illumination angles and treats the reconstructions from the conventional two-step approach as ground truth.It is then trained to reproduce equal fidelity from much fewer angles.After training,it performs with similar fidelity on the hitherto unexamined portions of the object,previously not shown during training,with a limited set of acquisitions.In our experimental demonstration,the nominal number of angles was 349 and the reduced number of angles was 21,resulting in a×140 aggregate speedup over a volume of 4.48×93.18×3.92μm^(3) and with(14 nm)^(3) feature size,i.e.-10^(8) voxels.RAPID’s key distinguishing feature over earlier attempts is the incorporation of atrous spatial pyramid pooling modules into the deep neural network framework in an anisotropic way.We found that adjusting the atrous rate improves reconstruction fidelity because it expands the convolutional kernels’range to match the physics of multi-slice ptychography without significantly increasing the number of parameters.
基金We are grateful to Jung Ki Song,Mo Deng,Baoliang Ge,William Harrod,Ed Cole,Zachary Levine,Bradley Alpert,Nina Weisse-Bernstein,Lee Oesterling,and Antonio Orozco for helpful discussions and comments.Funding from the Intelligence Advanced Research Projects Activity,Office of the Director of National Intelligence(IARPA-ODNI),contract FA8650-17-C-9113 is gratefully acknowledged.The MIT SuperCloud and Lincoln Laboratory Supercomputing Center provided resources(high performance computing,database,consultation)that have contributed to the research results reported within this paperI.Kang acknowledges support from Korea Foundation for Advanced Studies(KFAS).This research used resources of the Advanced Photon Source,a U.S.Department of Energy(DOE)Office of Science User Facility,operated for the DOE Office of Science by Argonne National Laboratory under Contract No.DE-AC02-06CH11357.The views and conclusions contained herein are those of the authors and should not be interpreted as necessarily representing the official policies or endorsements,either expressed or implied,of the ODNI,IARPA,or the US Government.
文摘Noninvasive X-ray imaging of nanoscale three-dimensional objects,such as integrated circuits(ICs),generally requires two types of scanning:ptychographic,which is translational and returns estimates of the complex electromagnetic field through the IC;combined with a tomographic scan,which collects these complex field projections from multiple angles.Here,we present Attentional Ptycho-Tomography(APT),an approach to drastically reduce the amount of angular scanning,and thus the total acquisition time.APT is machine learning-based,utilizing axial self-Attention for Ptycho-Tomographic reconstruction.APT is trained to obtain accurate reconstructions of the ICs,despite the incompleteness of the measurements.The training process includes regularizing priors in the form of typical patterns found in IC interiors,and the physics of X-ray propagation through the IC.We show that APT with×12 reduced angles achieves fidelity comparable to the gold standard Simultaneous Algebraic Reconstruction Technique(SART)with the original set of angles.When using the same set of reduced angles,then APT also outperforms Filtered Back Projection(FBP),Simultaneous Iterative Reconstruction Technique(SIRT)and SART.The time needed to compute the reconstruction is also reduced,because the trained neural network is a forward operation,unlike the iterative nature of these alternatives.Our experiments show that,without loss in quality,for a 4.48×93.2×3.92µm^(3) IC(≃6×10^(8) voxels),APT reduces the total data acquisition and computation time from 67.96 h to 38 min.We expect our physics-assisted and attention-utilizing machine learning framework to be applicable to other branches of nanoscale imaging,including materials science and biological imaging.
基金support by the Scientific Technology Innovation Platform of Fujian Province(2006L2003)Scientific Research Project of the Wuyi University(YJ201706)the Open Project Program of the Provincial Key Laboratory of Eco-Industrial Green Technology(Wuyi University,WYEF2018-8).
文摘Controllable conjunction of semiconductors with metal organic frameworks(MOFs)has been an efficient tool to enhance the chemical and physical properties of semiconductors by forming semiconductor–MOF hybrid structures.Herein,a novel MOFs-derived strategy to fabricate ZnO/ZIF-8 hybrid photocatalysts via the micro-catalysis technique by using ZIF-8 as a precursor and AgNO_(3) as a catalyst is reported.The properties and structures of ZnO/ZIF-8 hybrid photocatalysts can be effectively controlled by adjusting the concentration of AgNO_(3) solution.The as-prepared ZnO/ZIF-8 hybrid photocatalysts were characterized by XRD,SEM,TEM,UV-vis,BET and other techniques.Their photocatalytic performances were evaluated by degradation of rhodamine B(RhB)solution under UV light.The results indicate that ZnO/ZIF-8 photocatalysts exhibit excellent photocatalytic properties.ZnO/ZIF-8(50)exhibits the highest photocatalytic activity and can degrade 98.17%RhB after 12 min of UV light irradiation,which is higher than the degradation ability of P25(95.05%),benefiting from the synergistic effect of ZnO and ZIF-8.Furthermore,the ZnO/ZIF-8(50)photocatalyst shows high photostability.After four repeated cycles,its photocatalytic efficiency could be maintained at 95.54%.
