The open-air fabrication of quantum-dot light-emitting diodes(QLEDs)shows great potential for scalable manufacturing.However,the processing stability of QLED devices remains a fundamental barrier to their industrializ...The open-air fabrication of quantum-dot light-emitting diodes(QLEDs)shows great potential for scalable manufacturing.However,the processing stability of QLED devices remains a fundamental barrier to their industrialization.This study investigates the gas-related stability of QLEDs based on the ZnMgO electron transport layer(ETL).By analyzing the current density–voltage(J–V)characteristics of QLEDs and the corresponding sub-devices of functional layers in different gas environments,we demonstrate that the ZnMgO ETL plays a critical role in determining the gas-related stability of QLEDs.Further characterizations and density functional theory(DFT)calculations indicate that gas-induced surface reactions—particularly modifications to surface states and the formation of stable ZnMgO/OH—are the primary causes of performance degradation of QLEDs.展开更多
基金supported by grants from the National Natural Science Foundation of China(Nos.U23A20683 and 62301033)from the Ministry of Science and High Education of Russian Federation(Project No.FSRZ-2023-0006).
文摘The open-air fabrication of quantum-dot light-emitting diodes(QLEDs)shows great potential for scalable manufacturing.However,the processing stability of QLED devices remains a fundamental barrier to their industrialization.This study investigates the gas-related stability of QLEDs based on the ZnMgO electron transport layer(ETL).By analyzing the current density–voltage(J–V)characteristics of QLEDs and the corresponding sub-devices of functional layers in different gas environments,we demonstrate that the ZnMgO ETL plays a critical role in determining the gas-related stability of QLEDs.Further characterizations and density functional theory(DFT)calculations indicate that gas-induced surface reactions—particularly modifications to surface states and the formation of stable ZnMgO/OH—are the primary causes of performance degradation of QLEDs.
