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Design and fabrication of soft X-ray multilayer for broadband reflection
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作者 Zhanshan Wang Changjun Ke +3 位作者 Yueying Ma Tieqiang Zhang Jianlin Cao xingdan chen 《Chinese Science Bulletin》 SCIE EI CAS 1999年第21期1953-1956,共4页
A random method used for improving light throughput of a soft X-ray multilayer has been developed in the 18-20 nm spectral region, based on the traditional theory of periodic multilayer, and an 8% gain in integrated r... A random method used for improving light throughput of a soft X-ray multilayer has been developed in the 18-20 nm spectral region, based on the traditional theory of periodic multilayer, and an 8% gain in integrated reflectance is obtained. The ensemble calculation is presented at the same time, and the multilayer is fabricated by magnetron sputtering. 展开更多
关键词 SOFT X-ray MULTILAYER random number MAGNETRON SPUTTERING reflectance.
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