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Retained imaging quality with reduced manufacturing precision:leveraging computational optics
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作者 Yujie Xing Xiong Dun +6 位作者 Dinghao Yang Siyu Dong Yifan Peng Xuquan Wang Jun Yu Zhanshan Wang xinbin cheng 《Advanced Photonics Nexus》 2025年第4期128-139,共12页
Manufacturing-robust imaging systems leveraging computational optics hold immense potential for easing manufacturing constraints and enabling the development of cost-effective,high-quality imaging solutions.However,co... Manufacturing-robust imaging systems leveraging computational optics hold immense potential for easing manufacturing constraints and enabling the development of cost-effective,high-quality imaging solutions.However,conventional approaches,which typically rely on data-driven neural networks to correct optical aberrations caused by manufacturing errors,are constrained by the lack of effective tolerance analysis methods for quantitatively evaluating manufacturing error boundaries.This limitation is crucial for further relaxing manufacturing constraints and providing practical guidance for fabrication.We propose a physics-informed design paradigm for manufacturing-robust imaging systems with computational optics,integrating a physics-informed tolerance analysis methodology for evaluating manufacturing error boundaries and a physics-informed neural network for image reconstruction.With this approach,we achieve a manufacturing-robust imaging system based on an off-axis three-mirror freeform all-aluminum design,delivering a modulation transfer function exceeding 0.34 at the Nyquist frequency(72 lp/mm)in simulation.Notably,this system requires a manufacturing precision of only 0.5λin root mean square(RMS),representing a remarkable 25-fold relaxation compared with the conventional requirement of 0.02λin RMS.Experimental validation further confirmed that the manufacturing-robust imaging system maintains excellent performance in diverse indoor and outdoor environments.Our proposed method paves the way for achieving high-quality imaging without the necessity of high manufacturing precision,enabling practical solutions that are more cost-effective and time-efficient. 展开更多
关键词 manufacturing-robust imaging system computational optics physics-informed tolerance analysis physics-informed neural network
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Grating pitch comparison measurement based on Cr atomic transition frequency and Si lattice constant
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作者 Jingtong Feng Rao Xu +9 位作者 Ziruo Wu Lihua Lei Yingfan Xiong Zhaohui Tang Guangxu Xiao Yuying Xie Dongbai Xue Xiao Deng xinbin cheng Tongbao Li 《Chinese Physics B》 2025年第2期82-88,共7页
Traceability is the fundamental premise of all metrological activities. The establishment of a traceability chain characterized by a shortened structure, while simultaneously enabling on-site traceability, represents ... Traceability is the fundamental premise of all metrological activities. The establishment of a traceability chain characterized by a shortened structure, while simultaneously enabling on-site traceability, represents a key trend in the advancement of metrology. This study explores the periodic accuracy and overall uniformity of self-traceable gratings, employing multilayer film gratings with a nominal period of 25.00 nm as the medium. We present a comparative analysis of measurement capabilities in a self-traceable grating calibration system characterized by a ‘top-down’ calibration approach and a Si lattice constant calibration system characterized by a ‘bottom-up’ calibration approach. The results indicate that the values obtained for the multilayer film grating periods, calibrated using the self-traceable grating system, are 24.40 nm with a standard deviation of 0.11 nm. By comparing with the values derived from the Si lattice constant, which yield 24.34 nm with a standard deviation of 0.14 nm, the validity and feasibility of the self-traceable calibration system are confirmed. This system extends and complements existing metrological frameworks, offering a precise pathway for traceability in precision engineering and nanotechnology research. 展开更多
关键词 NANOMETROLOGY self-traceable standard material Si lattice constant
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Amorphous Si critical dimension structures with direct Si lattice calibration 被引量:6
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作者 Ziruo Wu Yanni Cai +4 位作者 Xingrui Wang Longfei Zhang Xiao Deng xinbin cheng Tongbao Li 《Chinese Physics B》 SCIE EI CAS CSCD 2019年第3期130-134,共5页
Developing highly accurate critical dimension standards is a significant task for nanoscale metrology. In this paper, we put forward an alternative approach to fabricate amorphous Si critical dimension structures with... Developing highly accurate critical dimension standards is a significant task for nanoscale metrology. In this paper, we put forward an alternative approach to fabricate amorphous Si critical dimension structures with direct Si lattice calibration in the same frame scanning transmission electron microscopy image. Based on the traceable measurement analysis, the optimized method can provide the same calibration accuracy and increase the fabrication throughput and lower the cost simultaneously, which benefits the application needs in atomic force microscopy(AFM) tip geometry characterization,benchmarking measurement tools, and conducting comparison measurements between different approaches. 展开更多
关键词 CRITICAL DIMENSION SI LATTICE transmission electron MICROSCOPY TIP characterizer
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Characterization of a nano line width reference material based on metrological scanning electron microscope 被引量:3
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作者 Fang Wang Yushu Shi +4 位作者 Wei Li Xiao Deng xinbin cheng Shu Zhang Xixi Yu 《Chinese Physics B》 SCIE EI CAS CSCD 2022年第5期203-211,共9页
The line width(often synonymously used for critical dimension,CD)is a crucial parameter in integrated circuits.To accurately control CD values in manufacturing,a reasonable CD reference material is required to calibra... The line width(often synonymously used for critical dimension,CD)is a crucial parameter in integrated circuits.To accurately control CD values in manufacturing,a reasonable CD reference material is required to calibrate the corresponding instruments.We develop a new reference material with nominal CDs of 160 nm,80 nm,and 40 nm.The line features are investigated based on the metrological scanning electron microscope which is developed by the National Institute of Metrology(NIM)in China.Also,we propose a new characterization method for the precise measurement of CD values.After filtering and leveling the intensity profiles,the line features are characterized by the combination model of the Gaussian and Lorentz functions.The left and right edges of CD are automatically extracted with the profile decomposition and k-means algorithm.Then the width of the two edges at the half intensity position is regarded as the standard CD value.Finally,the measurement results are evaluated in terms of the sample,instrument,algorithm,and repeatability.The experiments indicate efficiency of the proposed method which can be easily applied in practice to accurately characterize CDs. 展开更多
关键词 critical dimension line width metrological scanning electron microscopy TRACEABILITY
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Ka-Band metalens antenna empowered by physics-assisted particle swarm optimization(PA-PSO)algorithm 被引量:1
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作者 Shibin Jiang Wenjun Deng +4 位作者 Zhanshan Wang xinbin cheng Din Ping Tsai Yuzhi Shi Weiming Zhu 《Opto-Electronic Science》 2024年第10期23-33,共11页
Design of multiple-feed lens antennas requires multivariate and multi-objective optimization processes,which can be accelerated by PSO algorithms.However,the PSO algorithm often fails to achieve optimal results with l... Design of multiple-feed lens antennas requires multivariate and multi-objective optimization processes,which can be accelerated by PSO algorithms.However,the PSO algorithm often fails to achieve optimal results with limited computation resources since spaces of candidate solutions are quite large for lens antenna designs.This paper presents a design paradigm for multiple-feed lens antennas based on a physics-assisted particle swarm optimization(PA-PSO)algorithm,which guides the swarm of particles based on laws of physics.As a proof of concept,a design of compact metalens antenna is proposed,which measures unprecedented performances,such as a field of view at±55°,a 21.7 dBi gain with a flatness within 4 dB,a 3-dB bandwidth>12°,and a compact design with a f-number of 0.2.The proposed PA-PSO algorithm reaches the optimal results 6 times faster than the ordinary PSO algorithm,which endows promising applications in the multivariate and multi-objective optimization processes,including but not limited to metalens antenna designs. 展开更多
关键词 multiple-feed lens antennas PA-PSO algorithm metalens metasurfaces Ka-band antenna
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Optimization of laser focused atomic deposition by channeling
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作者 Jie Chen Jie Liu +3 位作者 Li Zhu Xiao Deng xinbin cheng Tongbao Li 《Chinese Physics B》 SCIE EI CAS CSCD 2020年第2期177-182,共6页
Laser focused atomic deposition is a unique and effective way to fabricate highly accurate pitch standards in nanometrology.However,the stability and repeatability of the atom lithography fabrication process remains a... Laser focused atomic deposition is a unique and effective way to fabricate highly accurate pitch standards in nanometrology.However,the stability and repeatability of the atom lithography fabrication process remains a challenging problem for massive production.Based on the atom-light interaction theory,channeling is utilized to improve the stability and repeatability.From the comparison of three kinds of atom-light interaction models,the optimal parameters for channeling are obtained based on simulation.According to the experimental observations,the peak to valley height of Cr nano-gratings keeps stable when the cutting proportion changes from 15%to 50%,which means that the channeling shows up under this condition.The channeling proves to be an effective method to optimize the stability and repeatability of laser focused Cr atomic deposition. 展开更多
关键词 laser FOCUSED ATOMIC DEPOSITION nano-grating LENGTH transition standards CHANNELING
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Influence of Small-Size Contaminations on Thin Film Structural Properties
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作者 F.V.Grigoriev V.B.Sulimov +3 位作者 Jinlong Zhang xinbin cheng Zhanshan Wang A.V.Tikhonravov 《Chinese Physics Letters》 SCIE CAS CSCD 2019年第3期82-85,共4页
An approach for studying the influence of nano-particles on the structural properties of deposited thin films is proposed. It is based on the molecular dynamic modeling of the deposition process in the presence of con... An approach for studying the influence of nano-particles on the structural properties of deposited thin films is proposed. It is based on the molecular dynamic modeling of the deposition process in the presence of contaminating nano-particles. The nano-particle is assumed to be immobile and its interaction with film atoms is described by a spherically symmetric potential. The approach is applied to the investigation of properties of silicon dioxide films. Visualization tools are used to investigate the porosity associated with nano-particles. The structure of the film near the nano-particle is studied using the radial distribution function. It is found that fluctuations of film density near the nano-particles are essentially different in the cases of low-energy and high-energy deposition processes. 展开更多
关键词 INFLUENCE Small-Size PROPERTIES
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Optical sorting:past,present and future 被引量:1
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作者 Meng Yang Yuzhi Shi +7 位作者 Qinghua Song Zeyong Wei Xiong Dun Zhiming Wang Zhanshan Wang cheng-Wei Qiu Hui Zhang xinbin cheng 《Light(Science & Applications)》 2025年第5期1188-1234,共47页
Optical sorting combines optical tweezers with diverse techniques,including optical spectrum,artificial intelligence(AI)and immunoassay,to endow unprecedented capabilities in particle sorting.In comparison to other me... Optical sorting combines optical tweezers with diverse techniques,including optical spectrum,artificial intelligence(AI)and immunoassay,to endow unprecedented capabilities in particle sorting.In comparison to other methods such as microfluidics,acoustics and electrophoresis,optical sorting offers appreciable advantages in nanoscale precision,high resolution,non-invasiveness,and is becoming increasingly indispensable in fields of biophysics,chemistry,and materials science.This review aims to offer a comprehensive overview of the history,development,and perspectives of various optical sorting techniques,categorised as passive and active sorting methods.To begin,we elucidate the fundamental physics and attributes of both conventional and exotic optical forces.We then explore sorting capabilities of active optical sorting,which fuses optical tweezers with a diversity of techniques,including Raman spectroscopy and machine learning.Afterwards,we reveal the essential roles played by deterministic light fields,configured with lens systems or metasurfaces,in the passive sorting of particles based on their varying sizes and shapes,sorting resolutions and speeds.We conclude with our vision of the most promising and futuristic directions,including AI-facilitated ultrafast and bio-morphology-selective sorting.It can be envisioned that optical sorting will inevitably become a revolutionary tool in scientific research and practical biomedical applications. 展开更多
关键词 optical spectrumartificial intelligence ai optical tweezers particle sortingin electrophoresisoptical sorting artificial intelligence optical sorting IMMUNOASSAY
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Metasurface higher-order poincare sphere polarization detection clock
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作者 Hui Yang Kai Ou +8 位作者 Qiang Liu Meiyu Peng Zhenwei Xie Yuting Jiang Honghui Jia xinbin cheng Hui Jing Yueqiang Hu Huigao Duan 《Light(Science & Applications)》 2025年第3期684-694,共11页
Accurately and swiftly characterizing the state of polarization(SoP)of complex structured light is crucial in the realms of classical and quantum optics.Conventional strategies for detecting SoP,which typically involv... Accurately and swiftly characterizing the state of polarization(SoP)of complex structured light is crucial in the realms of classical and quantum optics.Conventional strategies for detecting SoP,which typically involves a sequence of cascaded optical elements,are bulky,complex,and run counter to miniaturization and integration.While metasurfaceenabled polarimetry has emerged to overcome these limitations,its functionality predominantly remains confined to identifying SoP within the standard Poincare sphere framework.The comprehensive detection of SoP on the higherorder Poincare sphere(HOPS),however,continues to be a huge challenge.Here,we propose a general polarization metrology method capable of fully detecting SoP on any HOPS through a single measurement.The underlying mechanism relies on transforming the optical singularities and Stokes parameters into visualized intensity patterns,facilitating the extraction of all parameters that fully determine a SoP.We actualize this concept through a novel metadevice known as the metasurface photonics polarization clock,which offers an intuitive display of SoP using four distinct pointers.As a proof of concept,we theoretically and experimentally demonstrate fully resolving SoPs on the Oth,1st,and 2nd HOPSs.Our implementation opens up a new pathway towards real-time polarimetry of arbitrary beams featuring miniaturized size,a simple detection process,and a direct readout mechanism,promising significant advancements in fields reliant on polarization. 展开更多
关键词 standard poincare sphere fr cascaded optical elementsare identifying sop metasurface metasurfaceenabled polarimetry higher order Poincare sphere polarization detection classical quantum opticsconventional
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Toroidal dipole Fabry–Perot bound states in the continuum metasurfaces for ultrasensitive chiral detection
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作者 chengFENG LI TAO HE +8 位作者 XIAOFENG RAO CHAO FENG JINGYUAN ZHU SIYU DONG ZEYONG WEI HONGFEI JIAO YUZHI SHI ZHANSHAN WANG xinbin cheng 《Photonics Research》 2025年第9期2497-2509,共13页
Circular dichroism(CD)spectroscopy,widely used for chiral sensing,has been limited by the detection sensitivity.Enhancing optical chirality in the light fields interacting with chiral molecules is crucial for achievin... Circular dichroism(CD)spectroscopy,widely used for chiral sensing,has been limited by the detection sensitivity.Enhancing optical chirality in the light fields interacting with chiral molecules is crucial for achieving ultrasensitive chiral detection.Here,we present a new paradigm for ultrasensitive chiral detection by creating accessible chiral hotspots using a toroidal dipole Fabry–Perot bound state in the continuum(TD FP-BIC)metasurface.BIC resonance is achieved by controlling the coupling between the TD resonance and its multilayer reflector-induced perfect mirror image.This method enables unprecedented local maximum and average optical chirality enhancements of up to 6×10^(4)-fold and 2×10^(3)-fold,respectively,within non-structured regions,resulting in an 866-fold increase in CD signals compared to chiral molecules alone without nanostructures.Our results pave the way for enhanced light–matter interactions and ultrasensitive enantiomeric operation. 展开更多
关键词 toroidal dipole fabry perot bound state td r ultrasensitive chiral detectionherewe chiral molecules creating accessible chiral hotspots ultrasensitive chiral detection controlling coupling optical chirality
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Metasurface-enabled on-chip multiplexed diffractive neural networks in the visible 被引量:35
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作者 Xuhao Luo Yueqiang Hu +6 位作者 Xiangnian Ou Xin Li Jiajie Lai Na Liu xinbin cheng Anlian Pan Huigao Duan 《Light(Science & Applications)》 SCIE EI CAS CSCD 2022年第7期1443-1453,共11页
Replacing electrons with photons is a compelling route toward high-speed,massively parallel,and low-power artificial intelligence computing.Recently,diffractive networks composed of phase surfaces were trained to perf... Replacing electrons with photons is a compelling route toward high-speed,massively parallel,and low-power artificial intelligence computing.Recently,diffractive networks composed of phase surfaces were trained to perform machine learning tasks through linear optical transformations.However,the existing architectures often comprise bulky components and,most critically,they cannot mimic the human brain for multitasking.Here,we demonstrate a multi-skilled diffractive neural network based on a metasurface device,which can perform on-chip multi-channel sensing and multitasking in the visible.The polarization multiplexing scheme of the subwavelength nanostructures is applied to construct a multi-channel classifier framework for simultaneous recognition of digital and fashionable items.The areal density of the artificial neurons can reach up to 6.25×10^(6)mm^(-2) multiplied by the number of channels.The metasurface is integrated with the mature complementary metal-oxide semiconductor imaging sensor,providing a chip-scale architecture to process information directly at physical layers for energy-efficient and ultra-fast image processing in machine vision,autonomous driving,and precision medicine. 展开更多
关键词 VISIBLE AUTONOMOUS COMPLEMENTARY
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The effect of an electric field on the thermomechanical damage of nodular defects in dielectric multilayer coatings irradiated by nanosecond laser pulses 被引量:24
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作者 xinbin cheng Jinlong Zhang +3 位作者 Tao Ding Zeyong Wei Hongqiang Li Zhanshan Wang 《Light(Science & Applications)》 SCIE EI CAS 2013年第1期135-142,共8页
Thermomechanical damage of nodules in dielectric multilayer coatings that are irradiated by nanosecond laser pulses has been interpreted with respect to mechanical properties and electric-field enhancement.However,the... Thermomechanical damage of nodules in dielectric multilayer coatings that are irradiated by nanosecond laser pulses has been interpreted with respect to mechanical properties and electric-field enhancement.However,the effect of electric-field enhancement in nodular damage,especially the influence of electric-field distributions,has never been directly demonstrated through experimental results,which prevents the achievement of a clear understanding of the damage process of nodular defects.Here,a systematic and comparative study was designed to reveal how electric-field distributions affect the damage behavior of nodules.To obtain reliable results,two series of artificial nodules with different geometries and film absorption characteristics were prepared from monodisperse silica microspheres.After establishing simplified geometrical models of the nodules,the electric-field enhancement was simulated using a three-dimensional finite-difference time-domain code.Then,the damage morphologies of the artificial nodules were directly compared with the simulated electric-field intensity profiles.For both series of nodules,the damage morphologies reproduced our simulated electric-field intensity distributions very well.These results indicated that the electric-field distribution was actually a bridge that connected the nodular mechanical properties to the final thermomechanical damage.Understanding of the damage mechanism of nodules was deepened by obtaining data on the influence of electric-field distributions on the damage behavior of nodules. 展开更多
关键词 electric field nanosecond-pulse-laser damage nodular defects thin films
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Scattering exceptional point in the visible 被引量:5
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作者 Tao He Zhanyi Zhang +8 位作者 Jingyuan Zhu Yuzhi Shi Zhipeng Li Heng Wei Zeyong Wei Yong Li Zhanshan Wang cheng-Wei Qiu xinbin cheng 《Light(Science & Applications)》 SCIE EI CSCD 2023年第10期2228-2235,共8页
Exceptional point (EP) is a special degeneracy of non-Hermitian systems. One-dimensional transmission systems operating at EPs are widely studied and applied to chiral conversion and sensing. Lately, two-dimensional s... Exceptional point (EP) is a special degeneracy of non-Hermitian systems. One-dimensional transmission systems operating at EPs are widely studied and applied to chiral conversion and sensing. Lately, two-dimensional systems at EPs have been exploited for their exotic scattering features, yet so far been limited to only the non-visible waveband. Here, we report a universal paradigm for achieving a high-efficiency EP in the visible by leveraging interlayer loss to accurately control the interplay between the lossy structure and scattering lightwaves. A bilayer framework is demonstrated to reflect back the incident light from the left side ( | r_(−1) | >0.999) and absorb the incident light from the right side ( | r_(+1) | < 10^(–4)). As a proof of concept, a bilayer metasurface is demonstrated to reflect and absorb the incident light with experimental efficiencies of 88% and 85%, respectively, at 532 nm. Our results open the way for a new class of nanoscale devices and power up new opportunities for EP physics. 展开更多
关键词 VISIBLE exceptional INCIDENT
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Ultra-broadband reflector using double-layer subwavelength gratings 被引量:4
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作者 JINLONG ZHANG SHUAIKAI SHI +3 位作者 HONGFEI JIAO XIAOCHUAN JI ZHANSHAN WANG xinbin cheng 《Photonics Research》 SCIE EI CSCD 2020年第3期426-429,共4页
Double-layer high-contrast subwavelength gratings that are separated by a dielectric space layer are investigated to achieve ultra-broadband reflection.The reflection phase of subwavelength gratings and the propagatio... Double-layer high-contrast subwavelength gratings that are separated by a dielectric space layer are investigated to achieve ultra-broadband reflection.The reflection phase of subwavelength gratings and the propagation phase shift between two gratings are manipulated to expand reflection bandwidth by properly stacking two reflective gratings.A reflector exhibiting a 99%reflectance bandwidth of^1080 nm in the near-infrared is designed.Then this reflector is prepared using laser interference lithography and ion beam planarization,and an ultra-broadband reflection is achieved with reflectance exceeding 97%over a wavelength range of 955 nm in the near-infrared region. 展开更多
关键词 LITHOGRAPHY LAYER reflectance
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Scanning and Splicing Atom Lithography for Self-traceable Nanograting Fabrication 被引量:3
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作者 Xiao Deng Wen Tan +3 位作者 Zhaohui Tang Zichao Lin xinbin cheng Tongbao Li 《Nanomanufacturing and Metrology》 EI 2022年第2期179-187,共9页
Atom lithography is a unique method to fabricate self-traceable pitch standards and angle standards,but extending its structure area to millimeter-level for application is challenging.In this paper,on the one hand,we ... Atom lithography is a unique method to fabricate self-traceable pitch standards and angle standards,but extending its structure area to millimeter-level for application is challenging.In this paper,on the one hand,we put forward a new approach to fabricate a full-covered self-traceable Cr nanograting by inserting and scanning a Dove prism in the Gaussian beam direction of atom lithography.On the other hand,we extend the structure area along the standing-wave direction by splicing two-step atom deposition.Both nanostructures manufactured via scanning atom lithography and splicing atom lithography demonstrate good pitch accuracy,parallelism,continuity,and homogeneity,which opens a new way to fabricate centimeter-level full-covered self-traceable nanograting and lays the basis for the application of square ruler and optical encoders at the nanoscale. 展开更多
关键词 Scanning atom lithography Splicing atom lithography Nanograting Self-traceability Dove prism
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Damage characteristics of dual-band high reflectors affected by nodule defects in the femtosecond regime 被引量:2
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作者 Bin Ma Jiaqi Han +8 位作者 Jing Li Ke Wang Shuang Guan Xinshang Niu Haoran Li Jinlong Zhang Hongfei Jiao xinbin cheng Zhanshan Wang 《Chinese Optics Letters》 SCIE EI CAS CSCD 2021年第8期23-27,共5页
The influence of nodule defects on the characteristics of femtosecond laser-induced damage has not been fully investigated.In this study,two types of 800 nm/1064 nm dual-band HfO_(2)=Si O_(2) high-reflection films wit... The influence of nodule defects on the characteristics of femtosecond laser-induced damage has not been fully investigated.In this study,two types of 800 nm/1064 nm dual-band HfO_(2)=Si O_(2) high-reflection films with different configurations were analyzed.Combined with finite-difference time-domain electric field simulation and focused ion beam analysis,the initial state and growth process of femtosecond laser damage of nodules were explored.In particular,the sequence of blister damage determined by the film design and the inner damage caused by nodules were clarified.The rule of the laser-induced damage threshold of different size nodules was obtained.The difference in the damage behavior of nodules in the two types of films was elucidated. 展开更多
关键词 femtosecond laser damage nodule defects dual-band high reflectors
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Photonic-dispersion neural networks for inverse scattering problems 被引量:2
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作者 Tongyu Li Ang Chen +10 位作者 Lingjie Fan Minjia Zheng Jiajun Wang Guopeng Lu Maoxiong Zhao xinbin cheng Wei Li Xiaohan Liu Haiwei Yin Lei Shi Jian Zi 《Light(Science & Applications)》 SCIE EI CAS CSCD 2021年第10期1819-1828,共10页
Inferring the properties of a scattering objective by analyzing the optical far-field responses within the framework of inverse problems is of great practical significance.However,it still faces major challenges when ... Inferring the properties of a scattering objective by analyzing the optical far-field responses within the framework of inverse problems is of great practical significance.However,it still faces major challenges when the parameter range is growing and involves inevitable experimental noises.Here,we propose a solving strategy containing robust neuralnetworks-based algorithms and informative photonic dispersions to overcome such challenges for a sort of inverse scattering problem—reconstructing grating profiles.Using two typical neural networks,forward-mapping type and inverse-mapping type,we reconstruct grating profiles whose geometric features span hundreds of nanometers with nanometric sensitivity and several seconds of time consumption.A forward-mapping neural network with a parameters-to-point architecture especially stands out in generating analytical photonic dispersions accurately,featured by sharp Fano-shaped spectra.Meanwhile,to implement the strategy experimentally,a Fourier-optics-based angle-resolved imaging spectroscopy with an all-fixed light path is developed to measure the dispersions by a single shot,acquiring adequate information.Our forward-mapping algorithm can enable real-time comparisons between robust predictions and experimental data with actual noises,showing an excellent linear correlation(R2>0.982)with the measurements of atomic force microscopy.Our work provides a new strategy for reconstructing grating profiles in inverse scattering problems. 展开更多
关键词 SCATTERING DISPERSION NEURAL
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Waterproof coatings for high-power laser cavities 被引量:1
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作者 xinbin cheng Siyu Dong +4 位作者 Song Zhi Sebastian Paschel Istvan Balasa Detlev Ristau Zhanshan Wang 《Light(Science & Applications)》 SCIE EI CAS CSCD 2019年第1期1063-1068,共6页
With the ever-increasing laser power and repetition rate,thermal control of laser media is becoming increasingly important.Except for widely used air cooling or a bonded heat sink,water cooling of a laser medium is mo... With the ever-increasing laser power and repetition rate,thermal control of laser media is becoming increasingly important.Except for widely used air cooling or a bonded heat sink,water cooling of a laser medium is more effective in removing waste heat.However,how to protect deliquescent laser media from water erosion is a challenging issue.Here,novel waterproof coatings were proposed to shield Nd:Glass from water erosion.After clarifying the dependence of the waterproof property of single layers on their microstructures and pore characteristics,nanocomposites that dope SiO_(2) in HfO_(2) were synthesized using an ion-assisted co-evaporation process to solve the issue of a lack of a highindex material that simultaneously has a dense amorphous microstructure and wide bandgap.Hf_(0.7)Si_(0.3)O_(2)/SiO_(2) multifunctional coatings were finally shown to possess an excellent waterproof property,high laser-induced damage threshold(LIDT)and good spectral performance,which can be used as the enabling components for thermal control in high-power laser cavities. 展开更多
关键词 POWER HIGH PROPERTY
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Optical two-dimensional coherent spectroscopy of excitons in transition-metal dichalcogenides 被引量:1
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作者 YanZuo Chen ShaoGang Yu +3 位作者 Tao Jiang XiaoJun Liu xinbin cheng Di Huang 《Frontiers of physics》 SCIE CSCD 2024年第2期141-148,共8页
Exciton physics in atomically thin transition-metal dichalcogenides(TMDCs)holds paramount importance for fundamental physics research and prospective applications.However,the experimental exploration of exciton physic... Exciton physics in atomically thin transition-metal dichalcogenides(TMDCs)holds paramount importance for fundamental physics research and prospective applications.However,the experimental exploration of exciton physics,including excitonic coherence dynamics,exciton many-body interactions,and their optical properties,faces challenges stemming from factors such as spatial heterogeneity and intricate many-body effects.In this perspective,we elaborate upon how optical two-dimensional coherent spectroscopy(2DCS)emerges as an effective tool to tackle the challenges,and outline potential directions for gaining deeper insights into exciton physics in forthcoming experiments with the advancements in 2DCS techniques and new materials. 展开更多
关键词 monolayer transition-metal dichalcogenides two-dimensional coherent spectroscopy
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High beam quality 10 kW light source based on thin-film beam combination 被引量:1
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作者 Dongdong Li Xinshang Niu +7 位作者 Xiaochuan Ji Hongfei Jiao Jinlong Zhang Yujie Xing Jian Zhang Xiong Dun xinbin cheng Zhanshan Wang 《High Power Laser Science and Engineering》 CSCD 2024年第5期13-21,共9页
Thin-film beam combining technology is an effective approach to improve output power while maintaining beam quality However,the lack of comprehensive research into the key factors affecting the beam quality in systems... Thin-film beam combining technology is an effective approach to improve output power while maintaining beam quality However,the lack of comprehensive research into the key factors affecting the beam quality in systems makes it challenging to achieve a practical combined beam source with high brightness.This paper clearly established that the temperature rise of dichroic mirrors (DMs) and sub-beam overlapping precision are the main factors affecting the beam quality of the system,with quantified effects.Based on this understanding,a combined light source of four channels of3 kW fiber lasers was achieved,and an output power of 11.4 kW with a beam quality of M_(x)^(2)=1.601 and M_(y)^(2)=1.558using three high-steepness low-absorption DMs and the active control technique.To the best of our knowledge,this is the best beam quality for a 10 kW light source.This study offers a solution for practical high-power laser sources in the tens of kilowatts range. 展开更多
关键词 10 kW light source beam quality overlapping precision temperature rise thin-film beam combining technology
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