This paper presents a method(F method)for determining the optical constants and the thicknesses of semi- transparent thin films.It has the following distinctive features:high precision;rapid determination of the measu...This paper presents a method(F method)for determining the optical constants and the thicknesses of semi- transparent thin films.It has the following distinctive features:high precision;rapid determination of the measured quantities;wide range of convergence of solutions;capable of judging whether or not the results are reasonable.In order to meet the needs of application and engineering design,a family of curves designated Fig.n-F was prepared.Using it n,k,d of the films can be conveniently and accurately determined.From the optical constants and the thicknesses of the films determined by the F method,all important thermal radiation properties of the semi-transparent films needed in application can be obtained.展开更多
文摘This paper presents a method(F method)for determining the optical constants and the thicknesses of semi- transparent thin films.It has the following distinctive features:high precision;rapid determination of the measured quantities;wide range of convergence of solutions;capable of judging whether or not the results are reasonable.In order to meet the needs of application and engineering design,a family of curves designated Fig.n-F was prepared.Using it n,k,d of the films can be conveniently and accurately determined.From the optical constants and the thicknesses of the films determined by the F method,all important thermal radiation properties of the semi-transparent films needed in application can be obtained.
