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OBSERVATION OF EPITAXIAL OVERLAYER OF METALS AT ATOMIC LEVEL
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作者 t.t.tsong 《Acta Metallurgica Sinica(English Letters)》 SCIE EI CAS CSCD 1989年第4期231-236,共6页
Observation of epitaxial overlayer of metals at atomic level has been successfully observed in field ion microscope with 5 ns pulsed-laser heating.The condition of superlattice layer growth depends on the surface free... Observation of epitaxial overlayer of metals at atomic level has been successfully observed in field ion microscope with 5 ns pulsed-laser heating.The condition of superlattice layer growth depends on the surface free energy and the lattice misfit.Many defects,such as vacancies,va- cancy clusters,voids,dislocations and twins are produced during epitaxial growth because of the lattice misfit even though the condition of surface free energy is satisfied.Alloying is ob- served to occur on the surface of the metal during the epitaxial growth.Diffusion is probably via the exchange mechanism. 展开更多
关键词 field ion microscope epitaxial growth crystal defect diffusion mechanism SUPERLATTICE
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场离子显微镜和飞行时间原子探针及其在固体表面原子微观过程研究中的应用(二)
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作者 汪世才 t.t.tsong 《质谱学报》 EI CAS 1983年第4期11-22,共12页
利用FIM的原子分辨率和TOF原子探针的单原子鉴别本领,可以详细地研究固体表面的原子结构及化学成份等基本特性。根据对几种表面原子相互作用的研究,例如吸附原子间、吸附原子和基底原子间、吸附原子和杂质原子间。
关键词 原子探针 FIM 单原子 原子分辨率 原子层 原子簇 微观过程
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