主要比较氢氧化钙(CH)、矿物三氧化物聚合体(MTA)和IRoot BP Plus这3种生物材料盖髓剂在乳磨牙活髓切断术中的临床效果。使用相应的盖髓剂完成活髓切断术之后,分别在术后3、6和12个月进行复诊观察,分析术后治疗成功率、牙根吸收程度和...主要比较氢氧化钙(CH)、矿物三氧化物聚合体(MTA)和IRoot BP Plus这3种生物材料盖髓剂在乳磨牙活髓切断术中的临床效果。使用相应的盖髓剂完成活髓切断术之后,分别在术后3、6和12个月进行复诊观察,分析术后治疗成功率、牙根吸收程度和牙齿变色情况,比较3种生物材料盖髓剂的疗效。结果表明:3个组术后3个月治疗成功率和牙根吸收情况均无统计学意义(P>0.05),术后6、12个月治疗成功率和牙根吸收情况均具有统计学意义(P<0.05);IRoot BP Plus组和MAT组的成功率和牙根吸收情况均优于CH组(P<0.05);IRoot BP Plus组和CH组的牙齿变色发生情况优于MAT组,3个组的牙齿变色情况具有统计学意义(P<0.05)。3种生物材料盖髓剂中IRoot BP Plus材料更有利于乳磨牙活髓切断术的临床效果。展开更多
Using direct current-magnetron sputtering,Helium-trapped Ti films with a He/Ar mixture was studied.The relative helium content,helium depth profiles for the Ti films and crystallization capacity were analyzed by Enhan...Using direct current-magnetron sputtering,Helium-trapped Ti films with a He/Ar mixture was studied.The relative helium content,helium depth profiles for the Ti films and crystallization capacity were analyzed by Enhanced Proton Backscattering Spectrometry(EPBS)and X-ray diffraction(XRD).It was found that helium diffusion enhanced as more helium trapping into Ti films,and the He holding ratios were 95.9%,94.9%,93.9%,82.8% when the Ti films with the He/Ti of concentrations of 9.7 at.%,19.5 at.%,19.7 at.%,48.3 at.% were measured again 4 months later,respectively.The diffraction peaks be-came weak and wider,the peak of(002)plane was shifted to smaller diffraction angles and the relevant interplanar spacing d(hkl)increased gradually as more helium trapping into Ti films.The main peak was made trending to the(101)plane by both higher deposition temperature and more helium trapping.展开更多
文摘主要比较氢氧化钙(CH)、矿物三氧化物聚合体(MTA)和IRoot BP Plus这3种生物材料盖髓剂在乳磨牙活髓切断术中的临床效果。使用相应的盖髓剂完成活髓切断术之后,分别在术后3、6和12个月进行复诊观察,分析术后治疗成功率、牙根吸收程度和牙齿变色情况,比较3种生物材料盖髓剂的疗效。结果表明:3个组术后3个月治疗成功率和牙根吸收情况均无统计学意义(P>0.05),术后6、12个月治疗成功率和牙根吸收情况均具有统计学意义(P<0.05);IRoot BP Plus组和MAT组的成功率和牙根吸收情况均优于CH组(P<0.05);IRoot BP Plus组和CH组的牙齿变色发生情况优于MAT组,3个组的牙齿变色情况具有统计学意义(P<0.05)。3种生物材料盖髓剂中IRoot BP Plus材料更有利于乳磨牙活髓切断术的临床效果。
基金the China Academy of Engineering Physics(Grant No.2003Z0501)
文摘Using direct current-magnetron sputtering,Helium-trapped Ti films with a He/Ar mixture was studied.The relative helium content,helium depth profiles for the Ti films and crystallization capacity were analyzed by Enhanced Proton Backscattering Spectrometry(EPBS)and X-ray diffraction(XRD).It was found that helium diffusion enhanced as more helium trapping into Ti films,and the He holding ratios were 95.9%,94.9%,93.9%,82.8% when the Ti films with the He/Ti of concentrations of 9.7 at.%,19.5 at.%,19.7 at.%,48.3 at.% were measured again 4 months later,respectively.The diffraction peaks be-came weak and wider,the peak of(002)plane was shifted to smaller diffraction angles and the relevant interplanar spacing d(hkl)increased gradually as more helium trapping into Ti films.The main peak was made trending to the(101)plane by both higher deposition temperature and more helium trapping.
