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Post-hoc power analysis:a conceptually valid approach for power based on observed study data 被引量:2
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作者 Natalie E Quach Kun Yang +4 位作者 ruohui chen Justin Tu Manfei Xu Xin M Tu Xinlian Zhang 《General Psychiatry》 CAS CSCD 2022年第4期266-272,共7页
Power analysis is a key component of planning prospective studies such as clinical trials.However,some journals in biomedical and psychosocial sciences request power analysis for data already collected and analysed be... Power analysis is a key component of planning prospective studies such as clinical trials.However,some journals in biomedical and psychosocial sciences request power analysis for data already collected and analysed before acceptingmanuscripts for publication.Many have raised concerns about the conceptual basis for such post-hoc power analyses.More recently,Zhang et al showed by using simulation studies that such power analyses do not indicate true power for detecting statistical significance since post-hoc power estimates vary in the range of practical interests and can be very different from the true power.On the other hand,journals'request for information about the reliability of statistical findings in a manuscript due to small sample sizes is justified since the sample size plays an important role in the reproducibility of statistical findings.The problem is the wording of the journals'request,as the current power analysis paradigm is not designed to address journals'concerns about the reliability of the statistical findings.In this paper,we propose an alternate formulation of power analysis to provide a conceptually valid approach to the journals'wrongly worded but practically significant concern. 展开更多
关键词 POWER APPROACH SIZES
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Optical performances of near-infrared metalenses with process-induced defects
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作者 Xiaofei Liu ruohui chen +8 位作者 Yilin Lu chenxu Zhu Yang Qiu Xingyan Zhao Shaonan Zheng Qize Zhong Bo Cui Yuan Dong Ting Hu 《Chinese Optics Letters》 2025年第6期153-158,共6页
Defects are inevitably induced during the fabrication process of a metalens,which will affect the metalens's yield and optical performances.Thus,investigations on the fabrication defects are becoming increasingly ... Defects are inevitably induced during the fabrication process of a metalens,which will affect the metalens's yield and optical performances.Thus,investigations on the fabrication defects are becoming increasingly important for the mass production of metalenses.In this Letter,the optical performances of near-infrared metalenses with four types of fabrication defects are investigated.The results show that the process-induced defects obviously affect the focusing efficiency at λ=940 nm,but they have less impact on the quality of the focal spot.This work provides fabrication guidance for largescale manufacturing of metalenses in the future. 展开更多
关键词 near-infrared metalens DEFECT
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