A brief introduction to the historical background and current status of electron beam ion traps (EBITs)is presented. The structure and principles of an EBIT for producing highly charged ions are described. Finally,EBI...A brief introduction to the historical background and current status of electron beam ion traps (EBITs)is presented. The structure and principles of an EBIT for producing highly charged ions are described. Finally,EBITs as a potential tool in hot-plasma diagnostics and in studying frontier problems of highly charged ion physicsare discussed.展开更多
基金the Outstanding Young Scientist Program of the Natural Science Foundation of China(No.10125520)by the Outstanding Young Professor Project of the Ministry of Education of China
文摘A brief introduction to the historical background and current status of electron beam ion traps (EBITs)is presented. The structure and principles of an EBIT for producing highly charged ions are described. Finally,EBITs as a potential tool in hot-plasma diagnostics and in studying frontier problems of highly charged ion physicsare discussed.
