Several methods for investigating the thickness uniformity of polymer thin films are presented as well as their measurement principles. A comparison of these experimental methods is given.The cylindrical lightwave ref...Several methods for investigating the thickness uniformity of polymer thin films are presented as well as their measurement principles. A comparison of these experimental methods is given.The cylindrical lightwave reflection method is found to can obtain the thickness distribution along a certain direction.It is a simple and suitable method to evaluate the film thickness uniformity.展开更多
A new polymer composite thin film DMACB/PEK-c is reported. After poling of the film, the refractive indices n t and n n, that is the in-film-plane and the normal-to-film-plane refractive indices at 633 nm and the thic...A new polymer composite thin film DMACB/PEK-c is reported. After poling of the film, the refractive indices n t and n n, that is the in-film-plane and the normal-to-film-plane refractive indices at 633 nm and the thickness d were determined using the quasi-waveguide m -line method. The results of measurement and calculation are: n t=1.657 3±0.001 7, n n=1.627 8±0.001 9, and d =1.427 8±0.003 1 μm.展开更多
文摘Several methods for investigating the thickness uniformity of polymer thin films are presented as well as their measurement principles. A comparison of these experimental methods is given.The cylindrical lightwave reflection method is found to can obtain the thickness distribution along a certain direction.It is a simple and suitable method to evaluate the film thickness uniformity.
文摘A new polymer composite thin film DMACB/PEK-c is reported. After poling of the film, the refractive indices n t and n n, that is the in-film-plane and the normal-to-film-plane refractive indices at 633 nm and the thickness d were determined using the quasi-waveguide m -line method. The results of measurement and calculation are: n t=1.657 3±0.001 7, n n=1.627 8±0.001 9, and d =1.427 8±0.003 1 μm.
