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Two-stage Hall-Petch relationship in Cu with recrystallized structure 被引量:16
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作者 Y.Z.Tian Y.P.Ren +6 位作者 S.Gao r.x.zheng J.H.Wang H.C.Pan Z.F.Zhang N.Tsuji G.W.Qin 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2020年第13期31-35,共5页
Although Cu was studied extensively,the Hall-Petch relationship was mainly reported in the coarsegrained regime.In this work,fully recrystallized Cu specimens with a wide grain size regime of 0.51–14.93μm manifest a... Although Cu was studied extensively,the Hall-Petch relationship was mainly reported in the coarsegrained regime.In this work,fully recrystallized Cu specimens with a wide grain size regime of 0.51–14.93μm manifest a two-stage Hall-Petch relationship.There is a critical grain size of 3μm that divides stagesⅠandⅡwhere the Hall-Petch slope k value are quite different.The stageⅡis supposed to be validified down to 100 nm at least by comparing with a Cu-Ag alloy.The critical grain size varies in different materials systems,and the underline mechanisms are discussed based on the dislocation glide modes. 展开更多
关键词 CU Yield strength Hall-Petch relationship Ultrafine grain RECRYSTALLIZATION
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