The X-ray free-electron laser(XFEL),a new X-ray light source,presents numerous opportunities for scientific research.Self-amplified spontaneous emission(SASE)is one generation mode of XFEL in which each pulse is uniqu...The X-ray free-electron laser(XFEL),a new X-ray light source,presents numerous opportunities for scientific research.Self-amplified spontaneous emission(SASE)is one generation mode of XFEL in which each pulse is unique.In this paper,we propose a pinhole diffraction method to accurately determine the XFEL photon energy,pulses'photon energy jitter,and sample-to-detector distance for soft X-ray.This method was verified at Shanghai soft X-ray Free-Electron Laser(SXFEL).The measured average photon energy was 406.5 eV,with a photon energy jitter(root-mean-square)of 1.39 eV,and the sample-to-detector distance was calculated to be 16.61 cm.展开更多
基金supported by the Major State Basic Research Development Program of China(No.2022YFA1603703)the National Natural Science Foundation of China(No.12335020)+1 种基金the Strategic Priority Research Program of the Chinese Academy of Sciences(No.XDB37040303)supported by the Shanghai Soft X-ray Free-Electron Laser Beamline Project。
文摘The X-ray free-electron laser(XFEL),a new X-ray light source,presents numerous opportunities for scientific research.Self-amplified spontaneous emission(SASE)is one generation mode of XFEL in which each pulse is unique.In this paper,we propose a pinhole diffraction method to accurately determine the XFEL photon energy,pulses'photon energy jitter,and sample-to-detector distance for soft X-ray.This method was verified at Shanghai soft X-ray Free-Electron Laser(SXFEL).The measured average photon energy was 406.5 eV,with a photon energy jitter(root-mean-square)of 1.39 eV,and the sample-to-detector distance was calculated to be 16.61 cm.
