期刊文献+
共找到1篇文章
< 1 >
每页显示 20 50 100
Deep Learning,Feature Learning,and Clustering Analysis for SEM Image Classification
1
作者 Rossella Aversa piero coronica +1 位作者 Cristiano De Nobili Stefano Cozzini 《Data Intelligence》 2020年第4期513-528,共16页
In this paper,we report upon our recent work aimed at improving and adapting machine learning algorithms to automatically classify nanoscience images acquired by the Scanning Electron Microscope(SEM).This is done by c... In this paper,we report upon our recent work aimed at improving and adapting machine learning algorithms to automatically classify nanoscience images acquired by the Scanning Electron Microscope(SEM).This is done by coupling supervised and unsupervised learning approaches.We first investigate supervised learning on a ten-category data set of images and compare the performance of the different models in terms of training accuracy.Then,we reduce the dimensionality of the features through autoencoders to perform unsupervised learning on a subset of images in a selected range of scales(from 1μm to 2μm).Finally,we compare different clustering methods to uncover intrinsic structures in the images. 展开更多
关键词 Neural networks Feature learning Clustering analysis Scanning Electron Microscope(SEM) Image classification
原文传递
上一页 1 下一页 到第
使用帮助 返回顶部