期刊文献+
共找到1篇文章
< 1 >
每页显示 20 50 100
Software Reliability Growth Model for Imperfect Debugging Process Considering Testing-Effort and Testing Coverage
1
作者 Zang Sicong pi dechang 《Transactions of Nanjing University of Aeronautics and Astronautics》 EI CSCD 2018年第3期455-463,共9页
Because of the inevitable debugging lag,imperfect debugging process is used to replace perfect debugging process in the analysis of software reliability growth model.Considering neither testing-effort nor testing cove... Because of the inevitable debugging lag,imperfect debugging process is used to replace perfect debugging process in the analysis of software reliability growth model.Considering neither testing-effort nor testing coverage can describe software reliability for imperfect debugging completely,by hybridizing testing-effort with testing coverage under imperfect debugging,this paper proposes a new model named GMW-LO-ID.Under the assumption that the number of faults is proportional to the current number of detected faults,this model combines generalized modified Weibull(GMW)testing-effort function with logistic(LO)testing coverage function,and inherits GMW's amazing flexibility and LO's high fitting precision.Furthermore,the fitting accuracy and predictive power are verified by two series of experiments and we can draw a conclusion that our model fits the actual failure data better and predicts the software future behavior better than other ten traditional models,which only consider one or two points of testing-effort,testing coverage and imperfect debugging. 展开更多
关键词 software reliability testing-effort testing coverage imperfect debugging(ID) non-homogeneous Poisson process(NHPP)
在线阅读 下载PDF
上一页 1 下一页 到第
使用帮助 返回顶部