We report a systematic method to perform calculations of spectral line broadening parameters in plasmas. This method is applied to calculate Stark-broadening line profiles of Pα（n = 4 → n = 3） transitions under ce...We report a systematic method to perform calculations of spectral line broadening parameters in plasmas. This method is applied to calculate Stark-broadening line profiles of Pα（n = 4 → n = 3） transitions under certain specific plasma conditions, by treating this case as an example. In the framework of the fully relativistic Dirac R- matrix theory, we calculate the electron-impact broadening operators, which are assumed to be diagonal matrix to simplify the situation. The electric microfield distribution function is calculated by retaining Hooper＇s formalism. The dipole matrix elements and atomic structure parameters used in these calculations have been obtained from atomic structure GRASP code. Based on this required data, we calculate the Stark-broadened line profiles of the Paschen spectral lines in He Ⅱ ions in a systematic manner. Overall, there is a very good agreement between our calculated Stark-broadened line profiles and other line Our reported spectral line-broadening data have real also play a fundamental role in plasma modeling. broadening numerical simulation codes （Sire U and MELS）. applications in plasma spectroscopy, plasma diagnosis and展开更多
基金Supported by the National Natural Science Foundation of China under Grant Nos 11275029 and 11204017the Foundation for the Development of Science and Technology of Chinese Academy of Engineering Physics under Grant Nos 2013A0102005 and 2014A0102005
文摘We report a systematic method to perform calculations of spectral line broadening parameters in plasmas. This method is applied to calculate Stark-broadening line profiles of Pα（n = 4 → n = 3） transitions under certain specific plasma conditions, by treating this case as an example. In the framework of the fully relativistic Dirac R- matrix theory, we calculate the electron-impact broadening operators, which are assumed to be diagonal matrix to simplify the situation. The electric microfield distribution function is calculated by retaining Hooper＇s formalism. The dipole matrix elements and atomic structure parameters used in these calculations have been obtained from atomic structure GRASP code. Based on this required data, we calculate the Stark-broadened line profiles of the Paschen spectral lines in He Ⅱ ions in a systematic manner. Overall, there is a very good agreement between our calculated Stark-broadened line profiles and other line Our reported spectral line-broadening data have real also play a fundamental role in plasma modeling. broadening numerical simulation codes （Sire U and MELS）. applications in plasma spectroscopy, plasma diagnosis and
