In this research,influence of adding Li_(2)CO_(3)(at 0%,2%,4%,6%)on electrical and magnetic properties of Ni_(0.6)Mg_(0.4)Fe_(2)O_(4)(with 60%Ni and 40%Mg)ferrite has been studied.The samples are prepared by solid sta...In this research,influence of adding Li_(2)CO_(3)(at 0%,2%,4%,6%)on electrical and magnetic properties of Ni_(0.6)Mg_(0.4)Fe_(2)O_(4)(with 60%Ni and 40%Mg)ferrite has been studied.The samples are prepared by solid state reaction method and sintered at 1300℃ for 6 h.X-ray diffraction(XRD)patterns show the samples belong to single-phase cubic structure without any impurity phase.The magnetic properties(saturation magnetization and coercivity)of the samples have been investigated by VSM and found that the higher concentration of Li_(2)CO_(3)reduces the hysteresis loss.DC resistivity increases with Li_(2)CO_(3)contents whereas it decreases initially and then becomes constant at lower value with temperature which indicates that the studied samples are semiconductor.The dielectric dispersion occurs at a low-frequency regime and the loss peaks are formed in a higher frequency regime,which are due to the presence of resonance between applied frequency and hopping frequency of charge carriers.Notably,the loss peaks are shifted to the lower frequency with Li_(2)CO_(3)additions.展开更多
文摘In this research,influence of adding Li_(2)CO_(3)(at 0%,2%,4%,6%)on electrical and magnetic properties of Ni_(0.6)Mg_(0.4)Fe_(2)O_(4)(with 60%Ni and 40%Mg)ferrite has been studied.The samples are prepared by solid state reaction method and sintered at 1300℃ for 6 h.X-ray diffraction(XRD)patterns show the samples belong to single-phase cubic structure without any impurity phase.The magnetic properties(saturation magnetization and coercivity)of the samples have been investigated by VSM and found that the higher concentration of Li_(2)CO_(3)reduces the hysteresis loss.DC resistivity increases with Li_(2)CO_(3)contents whereas it decreases initially and then becomes constant at lower value with temperature which indicates that the studied samples are semiconductor.The dielectric dispersion occurs at a low-frequency regime and the loss peaks are formed in a higher frequency regime,which are due to the presence of resonance between applied frequency and hopping frequency of charge carriers.Notably,the loss peaks are shifted to the lower frequency with Li_(2)CO_(3)additions.
