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Study of Inner-Shell Excitation and Relaxation Processes in Atomic and Ionic Neon by Means of Soft X-Ray Spectroscopy
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作者 m.oura 《Plasma Science and Technology》 SCIE EI CAS CSCD 2010年第3期353-360,共8页
By using soft X-ray spectroscopy, we investigate the inner-shell excitation and relaxation processes in atomic and ionic neon targets. Resonant X-ray emission spectroscopy was applied to neutral neon atom in the regio... By using soft X-ray spectroscopy, we investigate the inner-shell excitation and relaxation processes in atomic and ionic neon targets. Resonant X-ray emission spectroscopy was applied to neutral neon atom in the regions of the [1s]np (n = 3, 4,…, ε) excited states and [1s2p]3pmp (m = 3,4) doubly excited states to obtain the spectroscopic information on the [2p]np and [2p^2]3prnp final electronic states, where square brackets indicate hole states. The energy levels of the [2p^2]3prnp (m = 3,4) electronic states were spectroscopically measured for the first time. As for the ionic neon target, on the other hand, the photoion yield spectroscopy was adopted to survey the 1s→ np (n = 2, 3) resonant excitation and subsequent Auger decay processes for Ne^+ target-ions. The observed Ne^2+ photoion yield spectrum is successflllly explained by the theoretical calculations based on the nmlticonfiguration Dirac-Fock method 展开更多
关键词 NEON PHOTOEXCITATION soft X-ray emission spectroscopy merged-beam method multi-configuration Dirac-Fock (MCDF) calculation
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