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All-reflective optical system design for extreme ultraviolet lithography 被引量:3
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作者 常军 邹美芳 +2 位作者 王蕊瑞 冯树龙 m.m.talha 《Chinese Optics Letters》 SCIE EI CAS CSCD 2010年第11期1082-1084,共3页
All-reflective optical systems,due to their material absorption and low refractive index,are used to create the most suitable devices in extreme ultraviolet lithography (EUVL).In this letter,we present a design for ... All-reflective optical systems,due to their material absorption and low refractive index,are used to create the most suitable devices in extreme ultraviolet lithography (EUVL).In this letter,we present a design for an all-reflective lithographic projection lens.We also discuss its design idea and structural system.After analysis of the four-mirror optical system,the initial structural parameters are determined,the optical system is optimized,and the tolerances of the system are analyzed.We also show the implementation of optimal layout and desired imaging performance. 展开更多
关键词 DESIGN Extreme ultraviolet lithography OPTIMIZATION Refractive index Systems analysis
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