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Effect of Yb^(3+) concentration on Er^(3+) luminescence properties of sol-gelderived silica-alumina xerogels
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作者 K.Tran Ngoc H.Pham Thanh +8 位作者 C.Nguyen Duc C.Armellini A.Chiasera m.ferrari Y.Jestin M.Montagna E.Moser S.Pelli G.C.Righini 《Optoelectronics Letters》 EI 2006年第5期354-357,共4页
Er^3- / Yb^3+ co - doped silica - alumina monolithic xerogels were prepared with the same concentration on 2 000 Er/Si ppm and 6 000 AI/Si ppm. The Yb/Si content was varied from 0 to 4 000 ppm. Densification of the s... Er^3- / Yb^3+ co - doped silica - alumina monolithic xerogels were prepared with the same concentration on 2 000 Er/Si ppm and 6 000 AI/Si ppm. The Yb/Si content was varied from 0 to 4 000 ppm. Densification of the samples was achieved by thermal treatment in air at 950 ~C for 120 hours with a heating rate 0.1 ~C / min. Photoluminescence spectroscopy was used to obtain information about the effective excitation efficiency of Er^3+ ions by co-doping with Yb^3- ions. The infrared-to-visible up-conversion luminescence has been investigated upon continuous wave excitation at 980 nm. The samples exhibit red, green and blue upconversion emission. It is found that the intensity of up-conversion luminescence increases with increasing Yb3- doping concentration. An opposite behavior is observed for the 4 I13/2 luminescence of the Er^3+ ions. 展开更多
关键词 铒离子 二氧化硅 干凝胶 光致发光
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Raman Technique in Determination of Size Distribution of Oxide and Semiconductor Nanoparticles
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作者 M.Ivanda K.Furic +11 位作者 S.Music M.Gotic M.Ristic A.Turkovic A.M.Tonejc I.Derd Z.CrnjakOrel M.Montagna m.ferrari M.Schmitt K.Babocsi W.Kiefer 《光散射学报》 2005年第3期245-247,共3页
This contribution reports on application of low-wavenumber Raman scattering on acoustical vibrational modes of nanoparticles.Theoretical background as well as the experimental results in determination of oxide and sem... This contribution reports on application of low-wavenumber Raman scattering on acoustical vibrational modes of nanoparticles.Theoretical background as well as the experimental results in determination of oxide and semiconductor particle size distribution will be presented. 展开更多
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