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Limits on rough-particle sizing with low-defocus interferometric imaging 被引量:2
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作者 M.Brunel l.ouldarbi +2 位作者 H.Shen G.Grehan S.Cetmellec 《Particuology》 SCIE EI CAS CSCD 2015年第5期52-58,共7页
We present a rigorous theoretical model for the influence of the aperture in interferometric out-of-focus imaging. We investigate the role of this effect on the properties of speckle-like patterns generated by irregul... We present a rigorous theoretical model for the influence of the aperture in interferometric out-of-focus imaging. We investigate the role of this effect on the properties of speckle-like patterns generated by irregular, rough particles. Finally, we determine the conditions under which these patterns are no longer representative of particle size but of the aperture itself and the defocus parameter. 展开更多
关键词 lnterferometric out-of-focus imaging Irregular rough particles Generalized Huygens-Fresnel integrals
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