Scanning probe microscopy(SPM)and atomic force microscopy(AFM)are widely used for surface imaging and characterization,combining nano-to atomic-scale precision with highly sensitive force measurements.Thus,AFM is cons...Scanning probe microscopy(SPM)and atomic force microscopy(AFM)are widely used for surface imaging and characterization,combining nano-to atomic-scale precision with highly sensitive force measurements.Thus,AFM is considered an enabling technology,impacting many scientific fields,including life and materials sciences.In addition to mapping interaction forces,AFM can be used for the precise application of forces(controlling both location and magnitude),in combination with the application of electrical bias and controlled environments.Moreover,when combined with advances in nanoscale probe technology,SPM-based nanofabrication enables state-of-the-art nanomanufacturing at interfaces.展开更多
文摘Scanning probe microscopy(SPM)and atomic force microscopy(AFM)are widely used for surface imaging and characterization,combining nano-to atomic-scale precision with highly sensitive force measurements.Thus,AFM is considered an enabling technology,impacting many scientific fields,including life and materials sciences.In addition to mapping interaction forces,AFM can be used for the precise application of forces(controlling both location and magnitude),in combination with the application of electrical bias and controlled environments.Moreover,when combined with advances in nanoscale probe technology,SPM-based nanofabrication enables state-of-the-art nanomanufacturing at interfaces.
