期刊文献+
共找到1篇文章
< 1 >
每页显示 20 50 100
Bulk and surface damages in complementary bipolar junction transistors produced by high dose irradiation
1
作者 j assaf 《Chinese Physics B》 SCIE EI CAS CSCD 2018年第1期430-437,共8页
Two complementary types NPN and PNP of bipolar junction transistors (BJTs) were exposed to higll dose of neutrons and gamma rays. The change in the base and collector currents, minority carriers lifetime, and curren... Two complementary types NPN and PNP of bipolar junction transistors (BJTs) were exposed to higll dose of neutrons and gamma rays. The change in the base and collector currents, minority carriers lifetime, and current gain factor/3 with respect to the dose were analyzed. The contributions of the base current according to the defect types were also reported. It was declared that the radiation effect of neutrons was almost similar between the two transistor types, this effect at high dose may decrease the value of/3 to less than one. The Messenger-Spratt equation was used to describe the experimental results in this case. However, the experimental data demonstrated that the effect of gamma rays was generally higher on NPN than PNP transistors. This is mainly attributed to the difference in the behavior of the trapped positive charges in the SiO2 layers. Meanwhile, this difference tends to be small for high gamma dose. 展开更多
关键词 bipolar junction transistors radiation effects surface damage bulk damage
原文传递
上一页 1 下一页 到第
使用帮助 返回顶部