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Characterization and Properties of Nanostructured Surface Layer in a Low Carbon Steel Subjected to Surface Mechanical Attrition 被引量:20
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作者 XingpingYONG gangliu 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2003年第1期1-4,共4页
关键词 Low carbon steel Surface mechanical attrition Surface nanocrystallization MICROSTRUCTURE HARDNESS
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Through Thickness Variation of Cross Shear Rolling Texture in Grain Oriented Silicon Steel 被引量:1
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作者 gangliu LiangZUO 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2002年第6期519-521,共3页
The texture inhomogeneity in cross shear rolled grain oriented Si steel was investigated by means of the through thickness texture analysis. For the chosen rolling reductions (55%, 66.5%) and mismatch speed ratios (1.... The texture inhomogeneity in cross shear rolled grain oriented Si steel was investigated by means of the through thickness texture analysis. For the chosen rolling reductions (55%, 66.5%) and mismatch speed ratios (1.0, 1.1, 1.3), the deformation textures in various thickness layers consist of three major components, i.e. strong γ-fiber, medium α-fiber and weak η-fiber, and they show an asymmetrical distribution throughout the thickness. The effect of reduction on the texture gradient is found to be more significant at and near the center layer; however, the effect of mismatch speed ratio is less important. In most cases, a strong {111}<112> texture component appears in the subsurface layers, that may favour the formation of a sharp Goss texture during the subsequent annealing. 展开更多
关键词 Cross shear rolling Grain oriented Si steel Deformation texture
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Refinement of Fourier Coefficients from the Stokes Deconvoluted Profile
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作者 gangliu ZhideLIANG 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2002年第2期97-98,共2页
Computer-aided experimental technique was used to study the Stokes deconvolution of X-ray diffraction profile. Considerable difference can be found between the Fourier coefficients obtained from the deconvolutions of ... Computer-aided experimental technique was used to study the Stokes deconvolution of X-ray diffraction profile. Considerable difference can be found between the Fourier coefficients obtained from the deconvolutions of singlet and doublet experimental profiles. Nevertheless, the resultant physical profiles corresponding to singlet and doublet profiles are identical. An approach is proposed to refine the Fourier coefficients, and the refined Fourier coefficients coincide well with that obtained from the deconvolution of singlet experimental profile. 展开更多
关键词 X-ray diffraction Fourier transforms Fourier coefficients
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