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Monte Carlo simulation of incident electrons passing through thin metal layer
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作者 Tian-Long He Hong-Liang xu +2 位作者 Kai-Ting Huang Zhi-Liang Ren de-rong xu 《Nuclear Science and Techniques》 SCIE CAS CSCD 2018年第7期182-190,共9页
A Monte Carlo simulation using two schemes,the discrete energy loss approach and the continuous slowing down approximation,was implemented in C++ to calculate the energy transmission coefficient and average energy los... A Monte Carlo simulation using two schemes,the discrete energy loss approach and the continuous slowing down approximation,was implemented in C++ to calculate the energy transmission coefficient and average energy loss for low-energy(1–10 keV) incident electrons passing through a thin metal layer.The simulation model uses the Ashley model for electron inelastic scattering,the electron elastic scattering cross section taken from the NIST database,and the stopping power derived from the full Penn algorithm.The results of the two schemes agree well with each other and can be used to quantitatively evaluate the shielding effect of a thin coated metal layer on incident electrons for a diamond amplified photocathode. 展开更多
关键词 蒙特卡罗模拟 金属层 电子 事件 模拟模型 NIST 防护效果 精力
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