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MT-Former:Multi-Task Hybrid Transformer and Deep Support Vector Data Description to Detect Novel anomalies during Semiconductor Manufacturing
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作者 Hyunsu Jeong chiho yoon +3 位作者 Hyunseok Lim Jaesuk Chang Sampa Misra Chulhong Kim 《Light: Advanced Manufacturing》 2025年第2期103-115,共13页
Defect inspection is critical in semiconductor manufacturing for product quality improvement at reduced production costs.A whole new manufacturing process is often associated with a new set of defects that can cause s... Defect inspection is critical in semiconductor manufacturing for product quality improvement at reduced production costs.A whole new manufacturing process is often associated with a new set of defects that can cause serious damage to the manufacturing system.Therefore,classifying existing defects and new defects provides crucial clues to fix the issue in the newly introduced manufacturing process.We present a multi-task hybrid transformer(MT-former)that distinguishes novel defects from the known defects in electron microscope images of semiconductors.MT-former consists of upstream and downstream training stages.In the upstream stage,an encoder of a hybrid transformer is trained by solving both classification and reconstruction tasks for the existing defects.In the downstream stage,the shared encoder is fine-tuned by simultaneously learning the classification as well as a deep support vector domain description(Deep-SVDD)to detect the new defects among the existing ones.With focal loss,we also design a hybrid-transformer using convolutional and an efficient self-attention module.Our model is evaluated on real-world data from SK Hynix and on publicly available data from magnetic tile defects and HAM10000.For SK Hynix data,MT-former achieved higher AUC as compared with a Deep-SVDD model,by 8.19%for anomaly detection and by 9.59%for classifying the existing classes.Furthermore,the best AUC(magnetic tile defect 67.9%,HAM1000070.73%)on the public dataset achieved with the proposed model implies that MT-former would be a useful model for classifying the new types of defects from the existing ones. 展开更多
关键词 Semiconductor defect inspection Deep-SVDD Multi-task learning Anomaly detection Hybridtransformer
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Deep learning-based virtual staining,segmentation,and classification in label-free photoacoustic histology of human specimens 被引量:1
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作者 chiho yoon Eunwoo Park +5 位作者 Sampa Misra Jin Young Kim Jin Woo Baik Kwang Gi Kim Chan Kwon Jung Chulhong Kim 《Light: Science & Applications》 SCIE EI CSCD 2024年第10期2353-2366,共14页
In pathological diagnostics,histological images highlight the oncological features of excised specimens,but they require laborious and costly staining procedures.Despite recent innovations in label-free microscopy tha... In pathological diagnostics,histological images highlight the oncological features of excised specimens,but they require laborious and costly staining procedures.Despite recent innovations in label-free microscopy that simplify complex staining procedures,technical limitations and inadequate histological visualization are still problems in clinical settings.Here,we demonstrate an interconnected deep learning(DL)-based framework for performing automated virtual staining,segmentation,and classification in label-free photoacoustic histology(PAH)of human specimens.The framework comprises three components:(1)an explainable contrastive unpaired translation(E-CUT)method for virtual H&E(VHE)staining,(2)an U-net architecture for feature segmentation,and(3)a DL-based stepwise feature fusion method(StepFF)for classification.The framework demonstrates promising performance at each step of its application to human liver cancers.In virtual staining,the E-CUT preserves the morphological aspects of the cell nucleus and cytoplasm,making VHE images highly similar to real H&E ones.In segmentation,various features(e.g.,the cell area,number of cells,and the distance between cell nuclei)have been successfully segmented in VHE images.Finally,by using deep feature vectors from PAH,VHE,and segmented images,StepFF has achieved a 98.00%classification accuracy,compared to the 94.80%accuracy of conventional PAH classification.In particular,StepFF’s classification reached a sensitivity of 100%based on the evaluation of three pathologists,demonstrating its applicability in real clinical settings.This series of DL methods for label-free PAH has great potential as a practical clinical strategy for digital pathology. 展开更多
关键词 STEPWISE Deep SPITE
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