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The Electrical Characterization and NIR Absorption of ITO Film under Different Sputtering Time
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作者 chao yipeng Tang Wu Wang Xuehui 《稀有金属材料与工程》 SCIE EI CAS CSCD 北大核心 2012年第S1期306-308,共3页
Indium-tin-oxide(ITO)films with different sputtering time have been prepared by dc magnetron sputtering method on PET substrate at room temperature.The film structure,thickness,electrical and optical properties are in... Indium-tin-oxide(ITO)films with different sputtering time have been prepared by dc magnetron sputtering method on PET substrate at room temperature.The film structure,thickness,electrical and optical properties are investigated through XRD,SEM,van der Pauw method and FTIR,respectively.The XRD results indicate that all the films are amorphous structure.With the increase of sputtering time,resistivity and transmittance decrease simultaneously.However the absorption gets stronger,especially in near-infrared light region.Through Drude model the plasma frequency is calculated and the calculation result is pretty consistent with films deposited at 60 and 90 min. 展开更多
关键词 ITO FILMS Drude model NEAR-INFRARED ABSORPTION
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