Phase is an intrinsic property of light,and thus a crucial parameter across numerous applications in modern optics.Various methods exist for measuring the phase of light,each presenting challenges and limitationsfrom ...Phase is an intrinsic property of light,and thus a crucial parameter across numerous applications in modern optics.Various methods exist for measuring the phase of light,each presenting challenges and limitationsfrom the mechanical stability requirements of free-space interferometers to the computational complexity usually associated with methods based on spatial light modulators.Here,we utilize a passive photonic integrated circuit to spatially probe phase and intensity distributions of free-space light beams.Phase information is encoded into intensity through a set of passive on-chip interferometers,allowing conventional detectors to retrieve the phase profile of light through single-shot intensity measurements.Furthermore,we use silicon nitride as a material platform for the waveguide architecture,facilitating multi-spectral utilization in the visible spectral range.Our approach for fast,multi-spectral,and spatially resolved measurement of intensity and phase enables a wide variety of potential applications,ranging from microscopy to free-space optical communication.展开更多
基金Bundesministerium fur Arbeit und Wirtschaft(CDL-SMBS)Osterreichische Nationalstiftung fir Forschung,Technologie und Entwicklung(CDL-SMBS)Christian Doppler Forschungsgesellschaft(CDL-SMBS).
文摘Phase is an intrinsic property of light,and thus a crucial parameter across numerous applications in modern optics.Various methods exist for measuring the phase of light,each presenting challenges and limitationsfrom the mechanical stability requirements of free-space interferometers to the computational complexity usually associated with methods based on spatial light modulators.Here,we utilize a passive photonic integrated circuit to spatially probe phase and intensity distributions of free-space light beams.Phase information is encoded into intensity through a set of passive on-chip interferometers,allowing conventional detectors to retrieve the phase profile of light through single-shot intensity measurements.Furthermore,we use silicon nitride as a material platform for the waveguide architecture,facilitating multi-spectral utilization in the visible spectral range.Our approach for fast,multi-spectral,and spatially resolved measurement of intensity and phase enables a wide variety of potential applications,ranging from microscopy to free-space optical communication.
