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Layered multiple scattering approach to Hard X-ray photoelectron diffraction:theory and application
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作者 Trung-Phuc Vo Olena Tkach +10 位作者 Sylvain Tricot Didier Sébilleau Jürgen Braun Aki Pulkkinen aimo winkelmann Olena Fedchenko Yaryna Lytvynenko Dmitry Vasilyev Hans-Joachim Elmers Gerd Schönhense Ján Minár 《npj Computational Materials》 2025年第1期1700-1714,共15页
Photoelectron diffraction(PED)is a powerful technique for resolving surface structures with subangstrom precision.At high photon energies,angle-resolved photoemission spectroscopy(ARPES)reveals PED effects,often chall... Photoelectron diffraction(PED)is a powerful technique for resolving surface structures with subangstrom precision.At high photon energies,angle-resolved photoemission spectroscopy(ARPES)reveals PED effects,often challenged by small cross-sections,momentum transfer,and phonon scattering.X-ray PED(XPD)is not only an advantageous approach but also exhibits unexpected effects.We present a PED implementation for the spin-polarized relativistic Korringa-Kohn-Rostoker(SPRKKR)package to disentangle them,employing multiple scattering theory and a one-step photoemission model.Unlike conventional real-space approaches,our method uses a k-space formulation via the layer-KKR method,offering efficient and accurate calculations across a wide energy range(20-8000 eV)without angular momentum or cluster size convergence issues.Additionally,the alloy analogymodel enables simulations of finite-temperature XPDand effects in soft/hard X-ray ARPES.Applications includemodeling circular dichroism in angular distributions(CDAD)in core-level photoemission of Si(100)2p and Ge(100)3p,excited by 6000 eV photons with circular polarization. 展开更多
关键词 resolving surface structures layered multiple scattering photoelectron diffraction ped hard x ray photoelectron diffraction spin polarized relativistic Korringa Kohn Rostoker angle resolved photoemission spectroscopy k space formulation phonon scatteringx ray
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