The reliability assessment problem for products subject to degradation and random shocks is investigated. Two kinds of probabilistic models are constructed, in which the dependent competing failure process is consider...The reliability assessment problem for products subject to degradation and random shocks is investigated. Two kinds of probabilistic models are constructed, in which the dependent competing failure process is considered. First, based on the assumption of cumulative shock, the probabilistic models for hard failure and soft failure are built respectively. On this basis, the dependent competing failure model involving degradation and shock processes is established. Furthermore, the situation of the shifting-threshold is also considered, in which the hard failure threshold value decreases to a lower level after the arrival of a certain number of shocks. A case study of fatigue crack growth is given to illustrate the proposed models. Numerical results show that shock has a significant effect on the failure process; meanwhile, the effect will be magnified when the value of the hard threshold shifts to a lower level.展开更多
In order to evaluate the reliability of long-lifetime products with degradation data, a new proportional hazard degradation model is proposed. By the similarity between time-degradation data and stress-accelerated lif...In order to evaluate the reliability of long-lifetime products with degradation data, a new proportional hazard degradation model is proposed. By the similarity between time-degradation data and stress-accelerated lifetime, and the failure rate function of degradation data which is assumed to be proportional to the time covariate, the reliability assessment based on a proportional hazard degradation model is realized. The least squares method is used to estimate the model＇s parameters. Based on the failure rate of the degradation data and the proportion function of the known time, the failure rate and the reliability function under the given time and the predetermined failure threshold can be extrapolated. A long life GaAs laser is selected as a case study and its reliability is evaluated. The results show that the proposed method can accurately describe the degradation process and it is effective for the reliability assessment of long lifetime products.展开更多
基金The National Natural Science Foundation of China(No.50405021)Graduate Training Innovative Projects Foundation of Jiangsu Province(No.CXLX12_0081)
文摘The reliability assessment problem for products subject to degradation and random shocks is investigated. Two kinds of probabilistic models are constructed, in which the dependent competing failure process is considered. First, based on the assumption of cumulative shock, the probabilistic models for hard failure and soft failure are built respectively. On this basis, the dependent competing failure model involving degradation and shock processes is established. Furthermore, the situation of the shifting-threshold is also considered, in which the hard failure threshold value decreases to a lower level after the arrival of a certain number of shocks. A case study of fatigue crack growth is given to illustrate the proposed models. Numerical results show that shock has a significant effect on the failure process; meanwhile, the effect will be magnified when the value of the hard threshold shifts to a lower level.
基金The National Natural Science Foundation of China (No.50405021)
文摘In order to evaluate the reliability of long-lifetime products with degradation data, a new proportional hazard degradation model is proposed. By the similarity between time-degradation data and stress-accelerated lifetime, and the failure rate function of degradation data which is assumed to be proportional to the time covariate, the reliability assessment based on a proportional hazard degradation model is realized. The least squares method is used to estimate the model＇s parameters. Based on the failure rate of the degradation data and the proportion function of the known time, the failure rate and the reliability function under the given time and the predetermined failure threshold can be extrapolated. A long life GaAs laser is selected as a case study and its reliability is evaluated. The results show that the proposed method can accurately describe the degradation process and it is effective for the reliability assessment of long lifetime products.
