摘要
HL-1装置逃逸电子扰动,硬X射线锯齿振荡和软X射线锯齿振荡关联,内破裂后硬X射线发射强度到其峰值的延迟时间,被解释为逃逸电子从q=1面附近输运到等离子体边缘时间。当有电子回旋共振预电离时,硬X射线显著减少;相反,电子回旋共振加热时,硬X射线明显地增加。
Perturbation produced by runaway electrons in the HL-1 device has been observed.It is shown that the perturbation of hard X-ray is correlated with negative spikes of the loop voltage and soft X-ray sawtooth oscillation. The maximum of the hard Xray intensity appears about 200μs after the internal disruption. The delay time increases slowly with the electron density,decre -ases rapidly with the atomic mass of the operating gas,and does not depend on the loop voltage and plasma current. Frequency spectrum for hard X-ray sawteeth is deduced using fast Fourier transfer(FFT).The main frequency is about 0.5kHz.In case of ECR preionization by injecting microwave power into the HL-1 device, the intensity of hard X-ray decreases obviously.On the contrary, with ECR heating, the intensity increases apparently.
出处
《核聚变与等离子体物理》
CAS
CSCD
北大核心
1992年第2期95-99,共5页
Nuclear Fusion and Plasma Physics
关键词
硬X射线扰动
HL-1装置
逃逸电子
Hard X-ray perturbation,Sawtooth oscillation,Delay time, Electron cyclotron resonance (ECR) preionization and heating.
