摘要
Four quanternary Zr-based bulk metallic glasses（BMGs）were selected,including the Zr_（46）Ti_2Cu_（45）Al_7,Zr_（61）Ti_2Cu_（25）Al_（12）,Zr_（55）Ti_4Ni_（22）Al_（19）and Zr_（55）Ti_2Co_（28）Al_（15）,due to their robust glass-forming ability and containing a single species of late transition metal（LTM）in compositions.Their pitting resistances in 0.6 M Na Cl aqueous solution were investigated to examine the role of LTM elements in the alloys,with electrochemical measurements,surface morphology observation and x-ray photoelectron spectrometry analysis.It is shown that in comparision with two Cu-bearing BMGs,Zr_（55）Ti_4Ni_（22）Al_（19）and Zr_（55）Ti_2Co_（28）Al_（15）BMGs exhibited significantly superior resistance to pitting.Zr_（61）Ti_2Cu_（25）Al_（12）,Zr_（55）Ti_4Ni_（22）Al_（19）and Zr_（55）Ti_2Co_（28）Al_（15）BMGs manifested distinct passivation behaviour,because of the formation of surface passive film mainly comprising of Zr O_2,Ti O_2and Al_2O_3.However,no significant differences in the electrochemical resistive properties and thicknesses of passive films were found between Zr_（61）Ti_2Cu_（25）Al_（12）and Zr_（55）Ti_4Ni_（22）Al_（19）BMGs.Nevertheless,at the passive film/metal interface,copper enrichment took place in Zr_（61）Ti_2Cu_（25）Al_（12）,whereas the nickel was slightly deficient at the interface in Zr_（55）Ti_4Ni_（22）Al_（19）.During pitting propagation,selective dissolution of the zirconium,titanium and aluminum over the copper took place in Zr_（61）Ti_2Cu_（25）Al_（12）,but it was not the case in Zr_（55）Ti_4Ni_（22）Al_（19）.For the two Cu-bearing BMGs,reduction of passive base metal elements in composition resulted in local selective dissolution,even absence of the passivation.
Four quanternary Zr-based bulk metallic glasses（BMGs）were selected,including the Zr_（46）Ti_2Cu_（45）Al_7,Zr_（61）Ti_2Cu_（25）Al_（12）,Zr_（55）Ti_4Ni_（22）Al_（19）and Zr_（55）Ti_2Co_（28）Al_（15）,due to their robust glass-forming ability and containing a single species of late transition metal（LTM）in compositions.Their pitting resistances in 0.6 M Na Cl aqueous solution were investigated to examine the role of LTM elements in the alloys,with electrochemical measurements,surface morphology observation and x-ray photoelectron spectrometry analysis.It is shown that in comparision with two Cu-bearing BMGs,Zr_（55）Ti_4Ni_（22）Al_（19）and Zr_（55）Ti_2Co_（28）Al_（15）BMGs exhibited significantly superior resistance to pitting.Zr_（61）Ti_2Cu_（25）Al_（12）,Zr_（55）Ti_4Ni_（22）Al_（19）and Zr_（55）Ti_2Co_（28）Al_（15）BMGs manifested distinct passivation behaviour,because of the formation of surface passive film mainly comprising of Zr O_2,Ti O_2and Al_2O_3.However,no significant differences in the electrochemical resistive properties and thicknesses of passive films were found between Zr_（61）Ti_2Cu_（25）Al_（12）and Zr_（55）Ti_4Ni_（22）Al_（19）BMGs.Nevertheless,at the passive film/metal interface,copper enrichment took place in Zr_（61）Ti_2Cu_（25）Al_（12）,whereas the nickel was slightly deficient at the interface in Zr_（55）Ti_4Ni_（22）Al_（19）.During pitting propagation,selective dissolution of the zirconium,titanium and aluminum over the copper took place in Zr_（61）Ti_2Cu_（25）Al_（12）,but it was not the case in Zr_（55）Ti_4Ni_（22）Al_（19）.For the two Cu-bearing BMGs,reduction of passive base metal elements in composition resulted in local selective dissolution,even absence of the passivation.
基金
supported by the National Natural Science Foundation of China under Grant No. 51571192
