摘要
针对基于NoC互连方式,具有多播路径传输功能的多核系统芯片,提出多播路径测试方法(Multicast paths testing method,MPTM)。首先,提出同构核的测试访问路径生成(test access path generation,TAPG)算法,消除路径死锁。其次,提出了支持片上响应比较的多播测试机制。最后,利用NoC中的虚通道设计,优化多条测试访问路径组合。实验结果表明,本方法比串行测试方法至少减少85%的测试时间;随着网络规模的扩大,效果更好。实验证明,同构核的集中分布也有利于进一步减少测试时间。
An efficient testing method called Multicast Paths Testing Method（MPTM） for NoC-based many-core and multicast-support SoC to reduce test time is presented in the paper.Firstly,Test Access Path Generation（TAPG） method is proposed to find a Test Access Path（TAP） for one kind of homogeneous cores and to avoid deadlock.Then,Multicast Testing Mechanism is presented to modify multicast communication protocol for test and to realize the test response comparison to analysis of the test results on chip.Finally,by using Virtual Channels,some TAPs could coexist for parallel testing.The experimental results show that MPTM could reduce test time by over 85% for large scale many-core SoC compared with serial testing,and have a better effect with growing NoC size.Furthermore,if homogenous cores are in the obviously concentrated distributions,it would farther decrease test time.
出处
《电子测量与仪器学报》
CSCD
2010年第10期911-917,共7页
Journal of Electronic Measurement and Instrumentation
基金
国家"973"重点基础研究发展计划(编号:2005CB321604)
国家自然科学基金重点项目(编号:70631003)
博士点基金新教师项目(编号:200803591033)
关键词
片上网络
系统芯片
多播通信
同构核
测试访问路径
networks-on-chip
system-on-chip
multicast communication
homogenous cores
test access path
