摘要
利用等离子体质谱（ＩＣＰ－ＭＳ）技术测试了硫化助熔剂法和稀土直接掺杂工艺合成电子俘获材料的化学计量比，结果表明，采用稀土直接掺杂工艺合成材料的化学计量比更接近设计值；通过分析电子俘获材料的发光机制和光谱测试结果。
Stoichiometry of the major activators in electron trapping materials (ETM),prepared by sulfurizing flux method (SFM) and the rare earth direct doped technique,is measured by means of the induction coupled plasma mass spectrum (ICP MS).It is shown that the rare earth direct doped technique is better than SFM.Influenced by the synthesizing conditions,the variation of valence state of the main activators,such as Eu in Cas∶Eu,Sm,is discussed by analyzing the charge trapping mechanism and spectra of ETM.
出处
《光子学报》
EI
CAS
CSCD
1998年第9期855-859,共5页
Acta Photonica Sinica
关键词
电子俘获材料
硫化助熔剂
稀土
掺杂工艺
Electron trapping material
Sulfurizing flux method
Rare earth direct doped technique ICP MS
